About: Imaging the local density of electronic states by very low energy electron reflectivity

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This work was concerned with the relationship between the reflectivity of very low energy electrons from a crystalline sample and its density of electron states above the vacuum level. Also, as different crystallographic orientations of the same single crystal exhibit different density of states, the usefulness of electron reflectivity at very low energies was demonstrated for the determination of crystallographic orientation. The technique chosen was the Scanning Low Energy Electron Microscopy (SLEEM) wich allows using arbitrarily low electron energies while preserving a very good image resolution. In our experiments, the incident electron energy ranged between 0 and 45 eV. This work was concerned with the relationship between the reflectivity of very low energy electrons from a crystalline sample and its density of electron states above the vacuum level. Also, as different crystallographic orientations of the same single crystal exhibit different density of states, the usefulness of electron reflectivity at very low energies was demonstrated for the determination of crystallographic orientation. The technique chosen was the Scanning Low Energy Electron Microscopy (SLEEM) wich allows using arbitrarily low electron energies while preserving a very good image resolution. In our experiments, the incident electron energy ranged between 0 and 45 eV. (en)
Title	Imaging the local density of electronic states by very low energy electron reflectivity Imaging the local density of electronic states by very low energy electron reflectivity (en)
skos:prefLabel	Imaging the local density of electronic states by very low energy electron reflectivity Imaging the local density of electronic states by very low energy electron reflectivity (en)
skos:notation	RIV/68081731:_____/12:00386397!RIV13-AV0-68081731
http://linked.open...avai/riv/aktivita	I
http://linked.open...avai/riv/aktivity	I
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Frank, Luděk Pokorná, Zuzana
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	140519
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00386397
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	very low energy scanning electron microscopy; reflectivity of slow electrons; crystalography orientation (en)
http://linked.open.../riv/klicoveSlovo	crystalography orientation reflectivity of slow electrons very low energy scanning electron microscopy
http://linked.open...ontrolniKodProRIV	[490EEFEDD80D]
http://linked.open...v/mistoKonaniAkce	Skalský dvůr
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Frank, Luděk Pokorná, Zuzana
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2012-06-25 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute of Scientific Instruments AS CR, v.v.i
https://schema.org/isbn	978-80-87441-07-7

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