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  • Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface.
  • Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface. (en)
Title
  • Characterization of industrial materials by slow and very slow electrons
  • Characterization of industrial materials by slow and very slow electrons (en)
skos:prefLabel
  • Characterization of industrial materials by slow and very slow electrons
  • Characterization of industrial materials by slow and very slow electrons (en)
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  • RIV/68081731:_____/12:00386393!RIV13-AV0-68081731
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  • 126819
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  • RIV/68081731:_____/12:00386393
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  • low energy scanning electron microscopy; complex steels; microstructure of materials (en)
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  • [6845723C2674]
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  • Skalský dvůr
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  • Brno
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  • Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
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  • Mikmeková, Šárka
  • Müllerová, Ilona
  • Frank, Luděk
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number of pages
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  • Institute of Scientific Instruments AS CR, v.v.i
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  • 978-80-87441-07-7
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