About: Effect of sample tilt on PEEM resolution

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In electron microscopy design, the systems are usually assumed to be perfectly aligned or that possible small imperfections can be eliminated by simple multipole correctors (centering deflectors, stigmators) without loss of resolution. However, in some cases, like in the cathode lens between the sample and the objective lens in the photoemission electron microscope, even a small imperfection can impair the resolution significantly. Because of the strong field between the sample and the objective lens, even a small tilt of the sample generates a parasitic dipole field, which decreases resolution and causes image deformations. We present a simulation of the influence of a small sample tilt on the system resolution based on modern computational methods that enable simulation of the whole system including the parasitic fields, proper setting of centering deflectors and stigmators. The resolution is determined by simulating the point spread function and finding the size of its significant part. The procedure is shown on realistic data from the literature. We found out that the resolution becomes worse mainly in the direction of the parasitic dipole field. In electron microscopy design, the systems are usually assumed to be perfectly aligned or that possible small imperfections can be eliminated by simple multipole correctors (centering deflectors, stigmators) without loss of resolution. However, in some cases, like in the cathode lens between the sample and the objective lens in the photoemission electron microscope, even a small imperfection can impair the resolution significantly. Because of the strong field between the sample and the objective lens, even a small tilt of the sample generates a parasitic dipole field, which decreases resolution and causes image deformations. We present a simulation of the influence of a small sample tilt on the system resolution based on modern computational methods that enable simulation of the whole system including the parasitic fields, proper setting of centering deflectors and stigmators. The resolution is determined by simulating the point spread function and finding the size of its significant part. The procedure is shown on realistic data from the literature. We found out that the resolution becomes worse mainly in the direction of the parasitic dipole field. (en)
Title	Effect of sample tilt on PEEM resolution Effect of sample tilt on PEEM resolution (en)
skos:prefLabel	Effect of sample tilt on PEEM resolution Effect of sample tilt on PEEM resolution (en)
skos:notation	RIV/68081731:_____/12:00385323!RIV13-AV0-68081731
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(IAA100650805)
http://linked.open...iv/cisloPeriodika	S1
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Oral, Martin Radlička, Tomáš
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	133235
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00385323
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	PEEM; LEEM; Aberrations; Misalignment; Sample tilt; Point spread function; Resolution (en)
http://linked.open.../riv/klicoveSlovo	Resolution Misalignment Aberrations LEEM PEEM Point spread function Sample tilt
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[AA33DF279070]
http://linked.open...i/riv/nazevZdroje	Ultramicroscopy
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Misalignment aberrations in electron optical systems
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	119
http://linked.open...iv/tvurceVysledku	Oral, Martin Radlička, Tomáš Lencová, B.
http://linked.open...ain/vavai/riv/wos	000308079200008
issn	0304-3991
number of pages	6 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.ultramic.2011.11.011

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