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  • Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scale down to units of electronvolts.
  • Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scale down to units of electronvolts. (en)
Title
  • Applications of the Scanning Low Energy Electron Microscope
  • Applications of the Scanning Low Energy Electron Microscope (en)
skos:prefLabel
  • Applications of the Scanning Low Energy Electron Microscope
  • Applications of the Scanning Low Energy Electron Microscope (en)
skos:notation
  • RIV/68081731:_____/12:00379913!RIV12-MSM-68081731
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  • I, P(ED0017/01/01), P(FR-TI3/323)
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  • S2
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  • 123446
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  • RIV/68081731:_____/12:00379913
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  • scanning low energy electron microscope; cathode lens (en)
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  • US - Spojené státy americké
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  • [E3B004E42A9F]
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  • Microscopy and Microanalysis
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  • 18
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  • Mikmeková, Šárka
  • Mikmeková, Eliška
  • Hovorka, Miloš
  • Müllerová, Ilona
  • Frank, Luděk
issn
  • 1431-9276
number of pages
http://bibframe.org/vocab/doi
  • 10.1017/S1431927612006836
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