About: Very low energy scanning electron microscopy in nanotechnology

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Very low energy scanning electron microscopy in nanotechnology Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The group of low energy electron microscopy at ISI AS CR in Brno has developed a methodology for very low energy scanning electron microscopy at high image resolution by means of an immersion electrostatic lens (the cathode lens) inserted between the illumination column of a conventional scanning electron microscope and the sample. In this way the microscope resolution can be preserved down to a landing energy of the electrons one or even fractions of an electronvolt. In the range of less than several tens of electronvolts the image signal generation processes include contrast mechanisms not met at higher energies, which respond to important features of the 3D inner potential of the target and visualise its local crystallinity as well as the electronic structure. The elecfron wavelength comparable with interatomic distances allows observation of various wave-optical phenomena in imaging. The group of low energy electron microscopy at ISI AS CR in Brno has developed a methodology for very low energy scanning electron microscopy at high image resolution by means of an immersion electrostatic lens (the cathode lens) inserted between the illumination column of a conventional scanning electron microscope and the sample. In this way the microscope resolution can be preserved down to a landing energy of the electrons one or even fractions of an electronvolt. In the range of less than several tens of electronvolts the image signal generation processes include contrast mechanisms not met at higher energies, which respond to important features of the 3D inner potential of the target and visualise its local crystallinity as well as the electronic structure. The elecfron wavelength comparable with interatomic distances allows observation of various wave-optical phenomena in imaging. (en)
Title	Very low energy scanning electron microscopy in nanotechnology Very low energy scanning electron microscopy in nanotechnology (en)
skos:prefLabel	Very low energy scanning electron microscopy in nanotechnology Very low energy scanning electron microscopy in nanotechnology (en)
skos:notation	RIV/68081731:_____/12:00375383!RIV12-MSM-68081731
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ED0017/01/01), P(IAA100650902), P(OE08012), Z(AV0Z20650511)
http://linked.open...iv/cisloPeriodika	8/9
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Hovorka, Miloš Müllerová, Ilona Mika, Filip Mikmeková, Šárka Frank, Luděk Mikmeková, Eliška Pokorná, Zuzana
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	177357
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00375383
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning electron microscopy; very low energy electrons; cathode lens; grain contrast; strain contrast; imaging of participates; dopant contrast; very low energy STEM; graphene (en)
http://linked.open.../riv/klicoveSlovo	cathode lens dopant contrast grain contrast graphene very low energy STEM scanning electron microscopy imaging of participates strain contrast very low energy electrons
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[92F5684CC51B]
http://linked.open...i/riv/nazevZdroje	International Journal of Nanotechnology
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	7 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Scanning transmission electron microscopy with very slow electrons Contrast and detection in scanning electron microscopy APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	9
http://linked.open...iv/tvurceVysledku	Mikmeková, Šárka Mikmeková, Eliška Hovorka, Miloš Müllerová, Ilona Frank, Luděk Mika, Filip Pokorná, Zuzana
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
issn	1475-7435
number of pages	22 (xsd:int)

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 58 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software