About: Multiple Probe Photonic Force Microscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance. Single beam optical trap (also known as optical tweezers) is created by a laser beam that is tightly focused by microscope objective with high numerical aperture. A dielectric particle in water medium is then dragged by optical forces to place of the highest optical intensity, i.e. to the laser beam focus. Photonic force microscopy (PFM) is a technique that utilizes optical tweezers for confining the local probe, usually a dielectric particle of a sub-micron diameter. I.e. PFM belongs to the of large family of scanning probe microscopy (SPM) techniques. We have used fluorescently labeled polymer sphere in order to conveniently measure the distance between the particle center and the focal point of the laser beam. To make the measurement more precise, we have measured two-photon-fluorescence, which is quickly decreasing with the probe-focus distance. (en)
Title	Multiple Probe Photonic Force Microscopy Multiple Probe Photonic Force Microscopy (en)
skos:prefLabel	Multiple Probe Photonic Force Microscopy Multiple Probe Photonic Force Microscopy (en)
skos:notation	RIV/68081731:_____/11:00368828!RIV12-MSM-68081731
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ED0017/01/01), P(LC06007), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Zemánek, Pavel Šerý, Mojmír Jákl, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	214320
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/11:00368828
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	photonic force microscopy; scanning probe microscopy; two-photon fluorescence; time-sharing traps (en)
http://linked.open.../riv/klicoveSlovo	photonic force microscopy scanning probe microscopy time-sharing traps two-photon fluorescence
http://linked.open...ontrolniKodProRIV	[0009AE03CBF1]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	NANOCON 2011. 3rd International Conference
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	APPLICATION LABORATORIES OF ADVANCED MICROTECHNOLOGIES AND NANOTECHNOLOGIES Centre of Modern Optics
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Zemánek, Pavel Jákl, Petr Šerý, Mojmír
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2011-09-21 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Tanger spol. s r. o
https://schema.org/isbn	978-80-87294-27-7

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