About: Advances in Low Energy Scanning Electron Microscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Among traditional methods of the electron microscopy (EM) the transmission EM operates at highest energies of electrons and the sample used to be immersed in strong magnetic field. The emission EM has its sample emitting very slow electrons in strong electric field of the cathode lens (CL). The conventional scanning EM (SEM) worked in the medium energy range with the sample in a field free space. Immersion of the SEM sample into magnetic field (and correction of aberrations) improved the resolution up to observation of single atoms. When transferring the CL principle into the SEM we preserve a small primary spot down to lowest energies with the electric field strength as a factor limiting the resolution. Among traditional methods of the electron microscopy (EM) the transmission EM operates at highest energies of electrons and the sample used to be immersed in strong magnetic field. The emission EM has its sample emitting very slow electrons in strong electric field of the cathode lens (CL). The conventional scanning EM (SEM) worked in the medium energy range with the sample in a field free space. Immersion of the SEM sample into magnetic field (and correction of aberrations) improved the resolution up to observation of single atoms. When transferring the CL principle into the SEM we preserve a small primary spot down to lowest energies with the electric field strength as a factor limiting the resolution. (en)
Title	Advances in Low Energy Scanning Electron Microscopy Advances in Low Energy Scanning Electron Microscopy (en)
skos:prefLabel	Advances in Low Energy Scanning Electron Microscopy Advances in Low Energy Scanning Electron Microscopy (en)
skos:notation	RIV/68081731:_____/10:00352422!RIV11-AV0-68081731
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA100650902), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Hovorka, Miloš Müllerová, Ilona Frank, Luděk
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	245534
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/10:00352422
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	electron microscopy; cathode lens; slow backscattered electrons; STEM; VLESTEM (en)
http://linked.open.../riv/klicoveSlovo	electron microscopy cathode lens STEM VLESTEM slow backscattered electrons
http://linked.open...ontrolniKodProRIV	[F6D127684AC4]
http://linked.open...v/mistoKonaniAkce	Rio de Janeiro
http://linked.open...i/riv/mistoVydani	Rio de Janeiro
http://linked.open...i/riv/nazevZdroje	Proceedings of the 17th IFSM International Microscopy Congress
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Scanning transmission electron microscopy with very slow electrons
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Hovorka, Miloš Müllerová, Ilona Frank, Luděk
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-09-19 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Sociedade Brasileira de Microscopia e Microanilise
https://schema.org/isbn	978-85-63273-06-2

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