About: Properties of Bi LIMS with ion clusters

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The ion beams used in SIMS are produced by liquid–metal ion sources (LMIS) which provide fine, optically bright ion beams even for low emission currents around 1 .mu.A or less. The typical energy of the primary beam varies from 10 to 40 keV. The properties of the LMIS are strongly limited by the effect of the Discrete Coulomb Interactions (DCI) near the source. The DCI increase the energy width (Boersh effect) and decrease the brightness of the source due to the trajectory displacement effect. Contrary to the Ga LMIS which contains mostly only Ga+ ions, in case of the Bi LMIS the ion beam consists of several ion types and clusters of ions with similar currents. Because each ion type has different charge and mass they will be accelerated to different velocities, which increase the number of interactions and decreases the quality of the source. The aim of this contribution is a simulation of the effect of the clusters on the source properties based on the MC simulation. The ion beams used in SIMS are produced by liquid–metal ion sources (LMIS) which provide fine, optically bright ion beams even for low emission currents around 1 .mu.A or less. The typical energy of the primary beam varies from 10 to 40 keV. The properties of the LMIS are strongly limited by the effect of the Discrete Coulomb Interactions (DCI) near the source. The DCI increase the energy width (Boersh effect) and decrease the brightness of the source due to the trajectory displacement effect. Contrary to the Ga LMIS which contains mostly only Ga+ ions, in case of the Bi LMIS the ion beam consists of several ion types and clusters of ions with similar currents. Because each ion type has different charge and mass they will be accelerated to different velocities, which increase the number of interactions and decreases the quality of the source. The aim of this contribution is a simulation of the effect of the clusters on the source properties based on the MC simulation. (en)
Title	Properties of Bi LIMS with ion clusters Properties of Bi LIMS with ion clusters (en)
skos:prefLabel	Properties of Bi LIMS with ion clusters Properties of Bi LIMS with ion clusters (en)
skos:notation	RIV/68081731:_____/10:00350670!RIV11-AV0-68081731
http://linked.open...avai/riv/aktivita	R Z
http://linked.open...avai/riv/aktivity	R, Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Radlička, Tomáš
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	282910
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/10:00350670
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	SIMS; liquid–metal ion sources (LMIS); discrete coulomb interactions (DCI) (en)
http://linked.open.../riv/klicoveSlovo	discrete coulomb interactions (DCI) liquid–metal ion sources (LMIS) SIMS
http://linked.open...ontrolniKodProRIV	[AD57527985CD]
http://linked.open...v/mistoKonaniAkce	Skalský dvůr
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Radlička, Tomáš
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-05-31 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Institute of Scientific Instruments AS CR, v.v.i
https://schema.org/isbn	978-80-254-6842-5

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