About: Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser     Goto   Sponge   NotDistinct   Permalink

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  • The desktop size capillary-discharge Ne-like Ar laser (CDL) providing 10-μJ nanosecond pulses of coherent 46.9-nm radiation with a repetition rate up to 12 Hz was developed and built at the Colorado State University in Fort Collins and then installed in Prague. The beam of the laser was focused by a spherical mirror covered with Si/Sc multilayer coating onto the surface of poly(methyl methacrylate) - PMMA. Interaction parameters vary by changing the distance between sample surface and beam focus. The samples were exposed to various numbers of shots. Analysis of damaged PMMA by atomic force (AFM) and Nomarski (DIC – differential interference contrast) microscopes allows not only to determine the key characteristics of the focused beam (e.g. Rayleigh’s parameter, focal spot diameter, tight focus position, etc.) but also to investigate mechanisms of the radiation-induced erosion processes.
  • The desktop size capillary-discharge Ne-like Ar laser (CDL) providing 10-μJ nanosecond pulses of coherent 46.9-nm radiation with a repetition rate up to 12 Hz was developed and built at the Colorado State University in Fort Collins and then installed in Prague. The beam of the laser was focused by a spherical mirror covered with Si/Sc multilayer coating onto the surface of poly(methyl methacrylate) - PMMA. Interaction parameters vary by changing the distance between sample surface and beam focus. The samples were exposed to various numbers of shots. Analysis of damaged PMMA by atomic force (AFM) and Nomarski (DIC – differential interference contrast) microscopes allows not only to determine the key characteristics of the focused beam (e.g. Rayleigh’s parameter, focal spot diameter, tight focus position, etc.) but also to investigate mechanisms of the radiation-induced erosion processes. (en)
Title
  • Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser
  • Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser (en)
skos:prefLabel
  • Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser
  • Characterization of the focused beam from a 10-Hz desktop capillary-discharge 46.9-nm laser (en)
skos:notation
  • RIV/68081731:_____/09:00335795!RIV10-MSM-68081731
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA203/06/1278), P(IAA400100701), P(IAAX00100903), P(KAN300100702), P(LA08024), P(LC510), P(LC528), Z(AV0Z10100523), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 306798
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/09:00335795
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • XUV laser; capillary-discharge laser; annular intensity distribution; beam imprint; photo-induced erosion (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [CEEA95886B4E]
http://linked.open...v/mistoKonaniAkce
  • Prague
http://linked.open...i/riv/mistoVydani
  • Bellingham
http://linked.open...i/riv/nazevZdroje
  • Damage to VUV, EUV, and X-ray Optics II
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Burian, T.
  • Chalupský, Jaromír
  • Hájková, Věra
  • Jakubczak, Krzysztof
  • Juha, Libor
  • Mocek, Tomáš
  • Pira, P.
  • Polan, Jiří
  • Rocca, J. J.
  • Rus, Bedřich
  • Sobota, Jaroslav
  • Vyšín, Luděk
  • Heinbuch, S.
  • Grisham, M.
  • Martz, D.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE
https://schema.org/isbn
  • 9780819476357
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