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  • The penetration of very low energy electrons (30 eV and less) into a specimen is proportional to its local density of states. This can be used for the mapping of dopants in semiconductors or of different crystal orientations in a polycrystalline sample. The experimental results for polycrystalline aluminium are presented.
  • The penetration of very low energy electrons (30 eV and less) into a specimen is proportional to its local density of states. This can be used for the mapping of dopants in semiconductors or of different crystal orientations in a polycrystalline sample. The experimental results for polycrystalline aluminium are presented. (en)
  • Průnik elektronů o nízké energii (30 eV a méně) do vzorku je úměrný jeho lokální hustotě stavů. To může být využito pro mapování dopantů v polovodičích nebo odlišných krystalografických orientací v polykrystalickém vzorku. Jsou představeny experimentální výsledky pro polykrystalický hliník. (cs)
Title
  • Mapping of the local density of states with very slow electrons in SEM
  • Mapování lokální hustoty stavů pomocí velmi pomalých elektronů v rastrovacím elektronovém mikroskopu (cs)
  • Mapping of the local density of states with very slow electrons in SEM (en)
skos:prefLabel
  • Mapping of the local density of states with very slow electrons in SEM
  • Mapování lokální hustoty stavů pomocí velmi pomalých elektronů v rastrovacím elektronovém mikroskopu (cs)
  • Mapping of the local density of states with very slow electrons in SEM (en)
skos:notation
  • RIV/68081731:_____/08:00315086!RIV09-AV0-68081731
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  • Z(AV0Z20650511)
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  • 377744
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  • RIV/68081731:_____/08:00315086
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  • density of states; SEM; very low energy electron microscopy (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [6F762400AAAF]
http://linked.open...v/mistoKonaniAkce
  • Aachen
http://linked.open...i/riv/mistoVydani
  • Berlin
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  • EMC 2008 - 14th European Microscopy Congress - Volume 1: Instrumentation and Methods
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  • Frank, Luděk
  • Pokorná, Zuzana
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http://linked.open...n/vavai/riv/zamer
number of pages
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  • Springer-Verlag
https://schema.org/isbn
  • 978-3-540-85154-7
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