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  • Poly[methyl(phenyl)silylene] (PMPSi) was selected as a typical representative of PSi. The cathodoluminescent (CL) device developed in our laboratory was used for study of PMPSi. CL spectrum of PMPSi corresponds to photoluminescence (PL) emission spectrum of the material used. UV emission decreases rapidly with the degradation, whereas visible one remains nearly stable during electron beam (EB) irradiation. The UV emission is related to the Si backbone. The visible emission is related to the existence of weak bonds and other defects on Si backbone. Infrared (IR) absorption spectroscopy was used to identify material changes caused by the EB degradation. IR spectra of PMPSi support the idea of Si-Si bonds deformation in the main chain of the material during the EB degradation.
  • Poly[methyl(phenyl)silylene] (PMPSi) was selected as a typical representative of PSi. The cathodoluminescent (CL) device developed in our laboratory was used for study of PMPSi. CL spectrum of PMPSi corresponds to photoluminescence (PL) emission spectrum of the material used. UV emission decreases rapidly with the degradation, whereas visible one remains nearly stable during electron beam (EB) irradiation. The UV emission is related to the Si backbone. The visible emission is related to the existence of weak bonds and other defects on Si backbone. Infrared (IR) absorption spectroscopy was used to identify material changes caused by the EB degradation. IR spectra of PMPSi support the idea of Si-Si bonds deformation in the main chain of the material during the EB degradation. (en)
  • Poly[methyl(phenyl)silylene] (PMPSi) byl zvolen jako typický representant PSi. Pro studium PMPSi bylo použito katodoluminiscenční (CL) zařízení vyvinuté v naší laboratoři. CL spektrum PMPSi odpovídá fotoluminiscenčnímu (PL) emisnímu spektru tohoto materiálu. UV emise se prudce snižuje s degradací, zatímco viditelná emise zůstává během ozařování elektronovým svazkem téměř beze změny. UV emise je vztahována k Si páteři, zatímco viditelná emise k existenci slabých vazeb a dalších defektů na Si páteři. Infračervená (IR) absorpční spektroskopie byla použita k nalezení změn způsobených degradací elektronovým svazkem. IR spektra PMPSi podporují myšlenku Si-Si deformace v průběhu degradace vazeb v hlavním řetězci materiálu. (cs)
Title
  • Mechanism of poly[methyl(phenyl)silylene] e-beam degradation
  • Mechanism of poly[methyl(phenyl)silylene] e-beam degradation (en)
  • Mechanismus degradace poly[methyl(phenyl)silylene] elektronovým svazkem (cs)
skos:prefLabel
  • Mechanism of poly[methyl(phenyl)silylene] e-beam degradation
  • Mechanism of poly[methyl(phenyl)silylene] e-beam degradation (en)
  • Mechanismus degradace poly[methyl(phenyl)silylene] elektronovým svazkem (cs)
skos:notation
  • RIV/68081731:_____/07:00095350!RIV08-AV0-68081731
http://linked.open.../vavai/riv/strany
  • 97;107
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(IAA100100622), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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http://linked.open...dnocenehoVysledku
  • 432609
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/07:00095350
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • poly[methyl(phenyl)silylene]; PMPSi; e-beam degradation; cathodoluminescence; photoluminescence; infrared absorption spectroscopy (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [F4D43062EF1F]
http://linked.open...v/mistoKonaniAkce
  • Krakow
http://linked.open...i/riv/mistoVydani
  • Pfinztal
http://linked.open...i/riv/nazevZdroje
  • 3rd European Weathering Symposium (XXVth Colloquium of Danubian Countries on Natural and Artificial Ageing of Polymers)
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Horák, Petr
  • Kuřitka, I.
  • Schauer, F.
  • Sáha, P.
  • Schauer, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • GUS
https://schema.org/isbn
  • 978-3-9810472-3-3
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