About: Very Low Energy Scanning Electron Microscopy

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Metoda rastrovací elektronové mikroskopie na velmi nízkých energiích pod cca 50 eV je souhrnně pojata počínaje fyzikou interakce velmi pomalých elektronů s pevnou látkou, přes princip zpomalení primárního elektronového svazku v SEM pomocí katodové čočky a vlastnosti této kombinace, popis kontrastních mechanismů, až po prezentaci výsledků demonstračních experimentů provedených na třídách vzorků důležitých pro jednotlivé oblasti materiálových věd. (cs) The method of very low energy scanning electron microscopy below about 50 eV is treated in full, starting from physics of interaction of very slow electrons with solids, through principle of deceleration of the primary electron beam in the SEM by means of the cathode lens and properties of this assembly, description of contrast mechanisms, up to presentation of results of demonstration experiments performed on families of samples important in various branches of materials science. The method of very low energy scanning electron microscopy below about 50 eV is treated in full, starting from physics of interaction of very slow electrons with solids, through principle of deceleration of the primary electron beam in the SEM by means of the cathode lens and properties of this assembly, description of contrast mechanisms, up to presentation of results of demonstration experiments performed on families of samples important in various branches of materials science. (en)
Title	Very Low Energy Scanning Electron Microscopy (en) Very Low Energy Scanning Electron Microscopy Rastrovací elektronová mikroskopie na velmi nízkých energiích (cs)
skos:prefLabel	Very Low Energy Scanning Electron Microscopy (en) Very Low Energy Scanning Electron Microscopy Rastrovací elektronová mikroskopie na velmi nízkých energiích (cs)
skos:notation	RIV/68081731:_____/07:00094363!RIV08-GA0-68081731
http://linked.open.../vavai/riv/strany	795;804
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/05/2327), P(GA202/04/0281), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open.../riv/druhVysledku	C - Kapitola v knize
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	457833
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/07:00094363
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	electron optics; scanning electron microscopy; low energy electrons; cathode lens mode; surfaces (en)
http://linked.open.../riv/klicoveSlovo	low energy electrons electron optics surfaces cathode lens mode scanning electron microscopy
http://linked.open...ontrolniKodProRIV	[CA993482E21E]
http://linked.open...i/riv/mistoVydani	Badajoz
http://linked.open...vEdiceCisloSvazku	3
http://linked.open...i/riv/nazevZdroje	Modern Research and Educational Topics in Microscopy
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Mapping at a high spatial resolution of the local density of electron states via reflection of very slow electrons Direct imaging of the dopant distribution in a semiconductor by means of low energy clectrons
http://linked.open...UplatneniVysledku	2007
http://linked.open...iv/tvurceVysledku	Müllerová, Ilona Frank, Luděk
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	10 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Formatex
https://schema.org/isbn	978-84-611-9420-9

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