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  • Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scanning electron microscope. Various systems for the detection of backscattered electrons are outlined. Special attention is paid to the scintillation BSE detector with YAG single crystal scintillator. Finally, high resolution images of various samples taken by this detector are presented.
  • Article deals with the high resolution imaging by means of backscattered electrons (BSE) in the scanning electron microscope. Various systems for the detection of backscattered electrons are outlined. Special attention is paid to the scintillation BSE detector with YAG single crystal scintillator. Finally, high resolution images of various samples taken by this detector are presented. (en)
  • Článek se zabývá vysokorozlišovacím zobrazováním pomocí zpětně odražených elektronů v rastrovacím elektronovém mikroskopu. Jsou nastíněny různé detekční systémy zpětně odražených elektronů. Zvláštní pozornost je věnována scintilačnímu BSE detektoru s monokrystalickým scintilátorem YAG. Na závěr jsou prezentovány obrázky různých vzorků o vysokém rozlišení pořízené tímto detektorem. (cs)
Title
  • High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope
  • Zobrazování s vysokým rozlišením pomocí zpětně odražených elektronů v rastrovacím elektronovém mikroskopu (cs)
  • High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope (en)
skos:prefLabel
  • High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope
  • Zobrazování s vysokým rozlišením pomocí zpětně odražených elektronů v rastrovacím elektronovém mikroskopu (cs)
  • High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope (en)
skos:notation
  • RIV/68081731:_____/07:00092625!RIV08-GA0-68081731
http://linked.open.../vavai/riv/strany
  • 165
http://linked.open...avai/riv/aktivita
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  • P(GA202/05/0607), P(KJB200650501), Z(AV0Z20650511)
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  • 424091
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/07:00092625
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • scanning electron microscopy; backscattered electrons; scintillation detector; high resolution (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [191526EEF7C0]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • 5th International Conference on Materials Structure and Micromechanics of Fracture. Abstract booklet
http://linked.open...in/vavai/riv/obor
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http://linked.open...vavai/riv/projekt
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  • Matějková, Jiřina
  • Rek, Antonín
  • Wandrol, Petr
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http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • VUTIUM
https://schema.org/isbn
  • 978-80-214-3434-9
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