About: High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope

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About: High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper deals with imaging by means of backscattered electrons in the high resolution scanning electron microscopy. Possible backscattered electrons detection systems are outlined and one of the most efficient, the high take of angle single crystal scintillation detector, is described in detail. Its advantages and disadvantages are discussed and the comparison with the secondary electron detection modes is shown. The high resolution micrographs taken by the backscattered electron detector as well as by the secondary electron detectors are displayed. This paper deals with imaging by means of backscattered electrons in the high resolution scanning electron microscopy. Possible backscattered electrons detection systems are outlined and one of the most efficient, the high take of angle single crystal scintillation detector, is described in detail. Its advantages and disadvantages are discussed and the comparison with the secondary electron detection modes is shown. The high resolution micrographs taken by the backscattered electron detector as well as by the secondary electron detectors are displayed. (en) Článek je o zobrazování s vysokým rozlišením v REM prostřednictvím zpětně odražených elektronů. Jsou diskutovány výhody a nevýhody a srovnání s modem detekce sekundárních elektronů. Jsou ukázána zobrazení pořízené pomocí BSE a rovněž SE. (cs)
Title	High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope Zobrazování s vysokým rozlišením pomocí zpětně odražených elektronů v rastrovacím elektronovém mikroskopu (cs) High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope (en)
skos:prefLabel	High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope Zobrazování s vysokým rozlišením pomocí zpětně odražených elektronů v rastrovacím elektronovém mikroskopu (cs) High Resolution Imaging by Means of Backscattered Electrons in the Scanning Electron Microscope (en)
skos:notation	RIV/68081731:_____/07:00092197!RIV08-GA0-68081731
http://linked.open.../vavai/riv/strany	313;316
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/05/0607), P(KJB200650501), Z(AV0Z20650511)
http://linked.open...iv/cisloPeriodika	-
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Rek, Antonín Matějková, Jiřina Wandrol, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	424092
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/07:00092197
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	SEM; backscattered eletrons; detection; imaging (en)
http://linked.open.../riv/klicoveSlovo	SEM detection imaging backscattered eletrons
http://linked.open...odStatuVydavatele	CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV	[4E0BF4A49C04]
http://linked.open...i/riv/nazevZdroje	Materials Science Forum
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Synthesis of carbon micro- and nanostructures by plasma technologies Detection of signal electrons in scaning electron microscopy with low primary beam energies
http://linked.open...UplatneniVysledku	2007
http://linked.open...v/svazekPeriodika	567-568
http://linked.open...iv/tvurceVysledku	Matějková, Jiřina Rek, Antonín Wandrol, Petr
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
issn	0255-5476
number of pages	4 (xsd:int)

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