About: The development of EOD program for the design of electron optical devices

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The paper gives an overview of recent development of program EOD and its application in the design of electron microscopes. The use of the program is illustrated on the computations of detectors in scanning electron microscopy. The paper gives an overview of recent development of program EOD and its application in the design of electron microscopes. The use of the program is illustrated on the computations of detectors in scanning electron microscopy. (en) Článek ilustruje nedávný vývoj programu EOD a jeho použití při návrhu elektronových mikroskopů. Použití programu je ilustrováno na výpočtech detektorů pro rastrovací elektronovou mikroskopii. (cs)
Title	The development of EOD program for the design of electron optical devices Vývoj programu EOD pro návrh elektronově optických zařízení (cs) The development of EOD program for the design of electron optical devices (en)
skos:prefLabel	The development of EOD program for the design of electron optical devices Vývoj programu EOD pro návrh elektronově optických zařízení (cs) The development of EOD program for the design of electron optical devices (en)
skos:notation	RIV/68081731:_____/07:00086239!RIV08-GA0-68081731
http://linked.open.../vavai/riv/strany	2;3
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/05/0886), Z(AV0Z20650511)
http://linked.open...iv/cisloPeriodika	Suppl. 3
http://linked.open...vai/riv/dodaniDat	2008
http://linked.open...aciTvurceVysledku	Lencová, Bohumila
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	416836
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/07:00086239
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	electron optical design; signal detection; electron microscopy (en)
http://linked.open.../riv/klicoveSlovo	electron microscopy electron optical design signal detection
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[DDF93BF73A19]
http://linked.open...i/riv/nazevZdroje	Microscopy and Microanalysis
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Investigation of the true secondary electrons detection systems in the newly conceived environmental scanning electron microscope
http://linked.open...UplatneniVysledku	2007
http://linked.open...v/svazekPeriodika	13
http://linked.open...iv/tvurceVysledku	Lencová, Bohumila Zlámal, J.
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
issn	1431-9276
number of pages	2 (xsd:int)

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