About: Measurement of surface details with nanometer resolution using several optically held probes

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Prezentujeme metodu mikroskopie s několika lokálními sondami drženými optickými silami. Pomocí akusto-optických deflektorů se rychle přepíná optická past mezi dvěma polohami, takže je vázané sondy nemohou opustit. Sondy jsou fluorescenčně barvené a jejich vertikální poloha se odečítá z úrovně dvoufotonové fluorescence. Tato technika detekování pozice je velmi citlivá a umožňuje dosáhnou rozlišení až 10 nm. Simultánní použití dvou sond zrychlí proces měření a umožní rastrování větších oblastí. (cs) Scanning probe microscopy with multiple optically held probes is presented. Acousto-optical deflectors are employed to rapidly switch the optical trap between two positions so that the trapped probes are not allowed to leave the trap region. The probes are fluorescently labelled and their vertical position is acquired from the level of two-photon fluorescence. This particle position detection technique is very sensitive and allows obtaining surface details with resolution better than 10 nm. Using two probes simultaneously accelerates the measurement process and allows scanning of larger regions. Scanning probe microscopy with multiple optically held probes is presented. Acousto-optical deflectors are employed to rapidly switch the optical trap between two positions so that the trapped probes are not allowed to leave the trap region. The probes are fluorescently labelled and their vertical position is acquired from the level of two-photon fluorescence. This particle position detection technique is very sensitive and allows obtaining surface details with resolution better than 10 nm. Using two probes simultaneously accelerates the measurement process and allows scanning of larger regions. (en)
Title	Measurement of surface details with nanometer resolution using several optically held probes Měření povrchových detailů s nanometrovým rozlišením pomocí několika opticky vázaných sond (cs) Measurement of surface details with nanometer resolution using several optically held probes (en)
skos:prefLabel	Measurement of surface details with nanometer resolution using several optically held probes Měření povrchových detailů s nanometrovým rozlišením pomocí několika opticky vázaných sond (cs) Measurement of surface details with nanometer resolution using several optically held probes (en)
skos:notation	RIV/68081731:_____/06:00048847!RIV07-AV0-68081731
http://linked.open.../vavai/riv/strany	61802A:1;6
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(IAA1065203), Z(AV0Z20650511)
http://linked.open...vai/riv/dodaniDat	2007
http://linked.open...aciTvurceVysledku	Zemánek, Pavel Šerý, Mojmír Jákl, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	484557
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/06:00048847
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning probe microscopy; photonic force microscopy; optical tweezers; surface profile measurements (en)
http://linked.open.../riv/klicoveSlovo	photonic force microscopy scanning probe microscopy optical tweezers surface profile measurements
http://linked.open...ontrolniKodProRIV	[A470E8078BBD]
http://linked.open...v/mistoKonaniAkce	Praha
http://linked.open...i/riv/mistoVydani	Bellingham
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE (Vol. 6180) Photonics, Devices, and Systems III
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	The use of combination of laser microbeam and cytometric techniques in the study of the structure and dynamics of human genome
http://linked.open...UplatneniVysledku	2006
http://linked.open...iv/tvurceVysledku	Liška, M. Zemánek, Pavel Jákl, Petr Šerý, Mojmír
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2005-06-08 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies
number of pages	6 (xsd:int)
http://purl.org/ne...btex#hasPublisher	SPIE
https://schema.org/isbn	0-8194-6236-5

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