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  • We present design and experimental setup for direct transformation of the relative change of distances in measuring arm of the Michelson interferometer to relative changes of the resonant optical-frequency of Fabry–Perot resonator. An external tunable laser source provides identification of one of the resonant optical frequency of the resonator by the frequency locking mechanism with synchronous detection technique in the servo loop feedback. Measured frequency values and values of interference phase acquired by the interferometer are simultaneously sampled step by step for each elongation position of PZT element. We used that experimental setup for the testing process where a verification of scale-linearity of Michelson interferometer with total resolution 0.3 nm is investigated.
  • We present design and experimental setup for direct transformation of the relative change of distances in measuring arm of the Michelson interferometer to relative changes of the resonant optical-frequency of Fabry–Perot resonator. An external tunable laser source provides identification of one of the resonant optical frequency of the resonator by the frequency locking mechanism with synchronous detection technique in the servo loop feedback. Measured frequency values and values of interference phase acquired by the interferometer are simultaneously sampled step by step for each elongation position of PZT element. We used that experimental setup for the testing process where a verification of scale-linearity of Michelson interferometer with total resolution 0.3 nm is investigated. (en)
  • V článku představujeme experimentální sestavu pro přímý převod relativní změny vzdálenosti měřené Michelsonovým interferometrem na rezonanční frekvenci Fabry-Perotova rezonátoru. Externí laditelný laser zajišťuje identifikaci aktuální rezonanční frekvence rezonátoru pomocí detekční techniky derivační spektroskopie. Měřené hodnoty pomocí Michelsonova interferometru a Fabry-Perotova rezonátoru jsou vzorkována v průběhu posuvu měřicího zrcadla řízeného pizeoelektrickým členem. Prokázali jsme tak, že lze touto metodou provádět verifikaci linearity stupnice Michelsonova interferometru s vysokým rozlišením, tj. 0,3 nm. (cs)
Title
  • The optical frequency method of distance measurement with sub-nanometer resolution
  • The optical frequency method of distance measurement with sub-nanometer resolution (en)
  • Metoda využívající optickou frekvenci pro měření vzdáleností se subnanometrovým rozlišením (cs)
skos:prefLabel
  • The optical frequency method of distance measurement with sub-nanometer resolution
  • The optical frequency method of distance measurement with sub-nanometer resolution (en)
  • Metoda využívající optickou frekvenci pro měření vzdáleností se subnanometrovým rozlišením (cs)
skos:notation
  • RIV/68081731:_____/05:00022397!RIV06-GA0-68081731
http://linked.open.../vavai/riv/strany
  • 252;257
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  • P(GP102/02/P122)
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  • 534700
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  • RIV/68081731:_____/05:00022397
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  • high-resolution laser interferometry; scale linearity (en)
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  • [89E1AF8D6305]
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  • Merida
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  • Bellingham
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  • Proceedings SPIE - The International Society for Optical Engineering
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http://linked.open...UplatneniVysledku
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  • Lazar, Josef
  • Číp, Ondřej
  • Petrů, František
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number of pages
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  • SPIE
https://schema.org/isbn
  • 0-8194-5757-4
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