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Description
  • Detection of backscattered electrons (BSE) in scanning electron microscopy (SEM) serves as an auxiliary method in the study of surfaces and composition of materials. Backscattered electrons have properties that are different from those of usually used secondary electrons. The achievement of the theoretical limit of resolution (0.6 - 0.8 nm for SE and 0.9 nm for BSE) depends not only on the properties of the electron source, properties of electron optics, specimen preparation technique, type of electrons, but also on the detection system efficiency
  • Detection of backscattered electrons (BSE) in scanning electron microscopy (SEM) serves as an auxiliary method in the study of surfaces and composition of materials. Backscattered electrons have properties that are different from those of usually used secondary electrons. The achievement of the theoretical limit of resolution (0.6 - 0.8 nm for SE and 0.9 nm for BSE) depends not only on the properties of the electron source, properties of electron optics, specimen preparation technique, type of electrons, but also on the detection system efficiency (en)
  • Detekce zpětně odražených elektronů v REM slouží jako metoda pro studium materiálového složení vzorku. Důvodem jsou odlišné vlastnosti BSE od SE dosažení teoretického limitu rozlišení 0,6-0,8nm pro SE a 0,9nm pro BSE závisí nejen na vlastnostech elektronového zdroje, vlastnostech elektronové optiky, preparační technice vzorku, ale také na účinnosti detekčního systému s novým typem scintilátoru YAGII (cs)
Title
  • Nanoresolution BSE images created using a new type of YAG II scintillator
  • Nanoresolution BSE images created using a new type of YAG II scintillator (en)
  • Nanometrové rozlišení BSE obrazů tvořených s využitím nového typu scintilátoru YAG II (cs)
skos:prefLabel
  • Nanoresolution BSE images created using a new type of YAG II scintillator
  • Nanoresolution BSE images created using a new type of YAG II scintillator (en)
  • Nanometrové rozlišení BSE obrazů tvořených s využitím nového typu scintilátoru YAG II (cs)
skos:notation
  • RIV/68081731:_____/04:00109032!RIV/2005/AV0/A12005/N
http://linked.open.../vavai/riv/strany
  • 75;76
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(IBS2065107)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 575313
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/04:00109032
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • scintillator;detection;imaging (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [722BA892E33B]
http://linked.open...v/mistoKonaniAkce
  • Antwerp
http://linked.open...i/riv/mistoVydani
  • Liege
http://linked.open...i/riv/nazevZdroje
  • EMC 2004 - Proceedings of the 13th European Microscopy Congress
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Autrata, Rudolf
  • Schauer, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Belgian Society for Microscopy
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