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  • The largest sample thickness usable for transmission electron microscopy (TEM) is determined by the inelastic and elastic mean free paths (IMFP and EMFP). At primary electron energies normally used for TEM (>50 keV), both the mean free paths decrease as the primary energy is lowered. Attaining a sufficient penetration through a transmission sample of a given thickness is then simply a question of using a suitably high primary energy. As the primary energy is lowered below about 100 eV, however, IMFP is predicted to stop decreasing and to begin to grow again. This opens up the exciting possibility of very low voltage TEM, with poorer resolution but greatly reduced radiation damage compared to conventional TEM
  • The largest sample thickness usable for transmission electron microscopy (TEM) is determined by the inelastic and elastic mean free paths (IMFP and EMFP). At primary electron energies normally used for TEM (>50 keV), both the mean free paths decrease as the primary energy is lowered. Attaining a sufficient penetration through a transmission sample of a given thickness is then simply a question of using a suitably high primary energy. As the primary energy is lowered below about 100 eV, however, IMFP is predicted to stop decreasing and to begin to grow again. This opens up the exciting possibility of very low voltage TEM, with poorer resolution but greatly reduced radiation damage compared to conventional TEM (en)
  • Největší možná tloušťka vzorku pro prozařovací elektronovou mikroskopii (TEM) je ovlivněna nepružnou a pružnou střední volnou dráhou (IMFP a EMFP). Při energiích běžně používaných v transmisní elektronové mikroskopii (>50 keV), obě střední volné dráhy se snižují s klesající energií primárního svazku. Proniknout dostatečně vzorkem dané tloušťky je potom pouze otázkou použití dostatečně vysoké energie primárních elektronů. Pokud je energie primárních elektronů snížena pod 100 eV, IMFP se opět zvyšuje. Toto otevírá možnost prozařovací elektronové mikroskopie pomalými elektrony, s nižším rozlišením ale velmi sníženým radiačním poškozením vzorku (cs)
Title
  • Very low energy scanning transmission electron microscopy
  • Very low energy scanning transmission electron microscopy (en)
  • Rastrovací prozařovací elektronová mikroskopie pomalými elektrony (cs)
skos:prefLabel
  • Very low energy scanning transmission electron microscopy
  • Very low energy scanning transmission electron microscopy (en)
  • Rastrovací prozařovací elektronová mikroskopie pomalými elektrony (cs)
skos:notation
  • RIV/68081731:_____/04:00109027!RIV/2005/AV0/A12005/N
http://linked.open.../vavai/riv/strany
  • 333;334
http://linked.open...avai/riv/aktivita
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  • P(KJB2065405)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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  • 592363
http://linked.open...ai/riv/idVysledku
  • RIV/68081731:_____/04:00109027
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  • energy electrons;inelastic mean free path;STEM (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [9CB255B54BF2]
http://linked.open...v/mistoKonaniAkce
  • Antwerp
http://linked.open...i/riv/mistoVydani
  • Liege
http://linked.open...i/riv/nazevZdroje
  • EMC 2004 - Proceedings of the 13th European Microscopy Congress
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Müllerová, Ilona
  • Hrnčiřík, Petr
  • Křivánek, O.
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
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  • Belgian Society for Microscopy
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