About: Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air.

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About: Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region. If interferometric measurements are carried out under atmospheric conditions (usual situation in industry), they measure optical path length of an unknown distance instead of its true geometrical value. It is caused by an index of refraction of air that introduces a multiplicative constant to measured results. If we want to obtain correct values, the knowledge of the index of refraction is necessary. Generally, the index of refraction can be measured by two ways: indirectly or directly. The first of them is based on parametric analysis of atmospheric properties as: relative humidity, pressure, temperature, concentration of CO.sub.2./sub. etc. Values of these parameters are processed then by Edlen formulas with 10.sup.-7./sup. order [1]. The direct methods are more precise then Edlen formulas (more than 10.sup.-7./sup.) but their practical implementation is more difficult. Devi Laser interferometers are even more precise distance measurement devices with resolution in nanometer or sub-nanometer region. If interferometric measurements are carried out under atmospheric conditions (usual situation in industry), they measure optical path length of an unknown distance instead of its true geometrical value. It is caused by an index of refraction of air that introduces a multiplicative constant to measured results. If we want to obtain correct values, the knowledge of the index of refraction is necessary. Generally, the index of refraction can be measured by two ways: indirectly or directly. The first of them is based on parametric analysis of atmospheric properties as: relative humidity, pressure, temperature, concentration of CO.sub.2./sub. etc. Values of these parameters are processed then by Edlen formulas with 10.sup.-7./sup. order [1]. The direct methods are more precise then Edlen formulas (more than 10.sup.-7./sup.) but their practical implementation is more difficult. Devi (en)
Title	Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air. Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air. (en)
skos:prefLabel	Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air. Temperature stabilization of semiconductor lasers for direct measurement of index of refraction of air. (en)
skos:notation	RIV/68081731:_____/03:12030080!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany	189 ; 193
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/02/1318), P(GP102/02/P122), Z(AV0Z2065902)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Matoušek, Radomil
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	630491
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/03:12030080
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	laser interferometers; temperature stabilization; refraction (en)
http://linked.open.../riv/klicoveSlovo	refraction temperature stabilization laser interferometers
http://linked.open...ontrolniKodProRIV	[084013C90269]
http://linked.open...v/mistoKonaniAkce	Brno [CZ]
http://linked.open...i/riv/mistoVydani	Brno
http://linked.open...i/riv/nazevZdroje	Proceedings of the International Conference and Competition Student EEICT 2003.
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	1 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Stable laser optical resonators and their application for measurements of parameters of gas media Detection methods for laser interferometer driven by semiconductor laser
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Matoušek, Vít
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2003-04-24 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Rozvoj fyzikálních metod, speciálních technologií a přístrojových principů využívajících elektronových a světelných svazků a radiofrekvenční spektroskopie
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Vysoké učení technické v Brně
https://schema.org/isbn	80-214-2401-X

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