About: Comparison of imaging with SE ionization and BSE scintillation detector in ESEM.

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About: Comparison of imaging with SE ionization and BSE scintillation detector in ESEM. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Environmental scanning electron microscopy (ESEM) or low-vacuum scanning electron microscopy (LV SEM) enables the visualisation of samples in a gaseous environment at the pressure of the specimen chamber from 1 Pa to over 1000 Pa. Detection of signal electrons, namely secondary electrons (SEs) cannot be realised in a gaseous environment of the specimen chamber in the same way as for the high vacuum SEM, because high voltage of the Everhart-Thornley detector is not compatible with the conductance of the low vacuum environment [1]. For this reason, gaseous ions which are ionised by SEs from the specimen are used for the detection in ESEM. For the detection of the backscattered electrons (BSEs), conventional scintillation detector is the best to use. Environmental scanning electron microscopy (ESEM) or low-vacuum scanning electron microscopy (LV SEM) enables the visualisation of samples in a gaseous environment at the pressure of the specimen chamber from 1 Pa to over 1000 Pa. Detection of signal electrons, namely secondary electrons (SEs) cannot be realised in a gaseous environment of the specimen chamber in the same way as for the high vacuum SEM, because high voltage of the Everhart-Thornley detector is not compatible with the conductance of the low vacuum environment [1]. For this reason, gaseous ions which are ionised by SEs from the specimen are used for the detection in ESEM. For the detection of the backscattered electrons (BSEs), conventional scintillation detector is the best to use. (en)
Title	Comparison of imaging with SE ionization and BSE scintillation detector in ESEM. Comparison of imaging with SE ionization and BSE scintillation detector in ESEM. (en)
skos:prefLabel	Comparison of imaging with SE ionization and BSE scintillation detector in ESEM. Comparison of imaging with SE ionization and BSE scintillation detector in ESEM. (en)
skos:notation	RIV/68081731:_____/03:12030031!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany	487 ; 488
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA102/01/1271), Z(AV0Z2065902)
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Autrata, Rudolf Neděla, Vilém Schauer, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	601730
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/03:12030031
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	ionisation detector; scintillation detector; environmental microscope (en)
http://linked.open.../riv/klicoveSlovo	ionisation detector environmental microscope scintillation detector
http://linked.open...ontrolniKodProRIV	[D580BC692CAD]
http://linked.open...v/mistoKonaniAkce	Pula [HR]
http://linked.open...i/riv/mistoVydani	Zagreb
http://linked.open...i/riv/nazevZdroje	Proceedings of the 6th Multinational Congress on Microscopy - European Extension.
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Autrata, Rudolf Neděla, Vilém Schauer, Petr Horký, D.
http://linked.open...vavai/riv/typAkce	EUR - Evropská
http://linked.open.../riv/zahajeniAkce	2003-06-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Rozvoj fyzikálních metod, speciálních technologií a přístrojových principů využívajících elektronových a světelných svazků a radiofrekvenční spektroskopie
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Croatian Society for Electron Microscopy

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