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  • Environmental scanning electron microscope operates with the gaseous environment in the specimen chamber. This environment causes specific conditions for the detection of signal electrons. Classical Everhart-Thornley detector cannot be exploited for the detection of secondary electrons because of the impossibility to use high enough electric field in a gaseous environment to add sufficient energy to secondary electrons for efficient scintillation. Ionization detector is therefore used for the detection of signal electrons in environmental SEM most frequently. At this detector a plate electrode with positive potential is positioned above the specimen, which lays on a grounded specimen holder. At operation signal electrons from the specimen are accelerated in electrical field to the positive electrode and are amplified in the process of impact ionisation in a gaseous environment. The positive electrode of the ionisation detects products of ionisation collisions caused by secondary, backscattered and p
  • Environmental scanning electron microscope operates with the gaseous environment in the specimen chamber. This environment causes specific conditions for the detection of signal electrons. Classical Everhart-Thornley detector cannot be exploited for the detection of secondary electrons because of the impossibility to use high enough electric field in a gaseous environment to add sufficient energy to secondary electrons for efficient scintillation. Ionization detector is therefore used for the detection of signal electrons in environmental SEM most frequently. At this detector a plate electrode with positive potential is positioned above the specimen, which lays on a grounded specimen holder. At operation signal electrons from the specimen are accelerated in electrical field to the positive electrode and are amplified in the process of impact ionisation in a gaseous environment. The positive electrode of the ionisation detects products of ionisation collisions caused by secondary, backscattered and p (en)
Title
  • Usage of Segmental Ionization Detector in Environmental Conditions.
  • Usage of Segmental Ionization Detector in Environmental Conditions. (en)
skos:prefLabel
  • Usage of Segmental Ionization Detector in Environmental Conditions.
  • Usage of Segmental Ionization Detector in Environmental Conditions. (en)
skos:notation
  • RIV/68081731:_____/03:12030028!RIV/2004/AV0/A12004/N
http://linked.open.../vavai/riv/strany
  • 142 ; 143
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/01/1271), Z(AV0Z2065902)
http://linked.open...iv/cisloPeriodika
  • Sup. 3
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 632271
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  • RIV/68081731:_____/03:12030028
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • segmental ionization detector; scanning electron microscope; gaseous environment (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [90CD6EF255A4]
http://linked.open...i/riv/nazevZdroje
  • Microscopy and Microanalysis
http://linked.open...in/vavai/riv/obor
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http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 9
http://linked.open...iv/tvurceVysledku
  • Autrata, Rudolf
  • Jirák, J.
  • Schneider, L.
http://linked.open...n/vavai/riv/zamer
issn
  • 1431-9276
number of pages
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