About: SEM imaging of nonconductive powders at critical energy.     Goto   Sponge   NotDistinct   Permalink

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Description
  • As a rule, at electron energies normally used in SEM, the total electron yield is lower then 100% and some negative charge is dissipated in the specimen. This prevents observation of nonconductors in which the injected charge stays localized and its field destroys both geometry and brightness scale of the image.
  • As a rule, at electron energies normally used in SEM, the total electron yield is lower then 100% and some negative charge is dissipated in the specimen. This prevents observation of nonconductors in which the injected charge stays localized and its field destroys both geometry and brightness scale of the image. (en)
Title
  • SEM imaging of nonconductive powders at critical energy.
  • SEM imaging of nonconductive powders at critical energy. (en)
skos:prefLabel
  • SEM imaging of nonconductive powders at critical energy.
  • SEM imaging of nonconductive powders at critical energy. (en)
skos:notation
  • RIV/68081731:_____/02:12020036!RIV/2003/AV0/A12003/N
http://linked.open.../vavai/riv/strany
  • 73 ; 74
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  • Z(AV0Z2065902)
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  • 663240
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  • RIV/68081731:_____/02:12020036
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  • SEM; critical energy; slow secondary electronscathode heating (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [6952B96709F5]
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  • Vranovská Ves [CZ]
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  • Brno
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  • Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society.
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  • Müllerová, Ilona
  • Frank, Luděk
  • Káňová, Jitka
  • Zdražil, Josef
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number of pages
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  • CSMS
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  • 80-238-8749-1
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