About: Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures.     Goto   Sponge   NotDistinct   Permalink

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Description
  • The contribution is oriented to the area of scanning electron microscopy operated in the specimen chamber at higher pressures reaching hundreds to thousands of Pa. It deals with questions of signal detection and with the study of the effect of parameters of the incident primary electron beam on signal detection.
  • The contribution is oriented to the area of scanning electron microscopy operated in the specimen chamber at higher pressures reaching hundreds to thousands of Pa. It deals with questions of signal detection and with the study of the effect of parameters of the incident primary electron beam on signal detection. (en)
Title
  • Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures.
  • Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures. (en)
skos:prefLabel
  • Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures.
  • Effect of the electron beam accelerating voltage and of specimen coating on the image in the microscope operating at higher pressures. (en)
skos:notation
  • RIV/68081731:_____/00:12000027!RIV/2003/AV0/A12003/N
http://linked.open.../vavai/riv/strany
  • I245;I246
http://linked.open...avai/riv/aktivita
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  • P(GA102/00/0969), Z(AV0Z2065902)
http://linked.open...vai/riv/dodaniDat
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  • 709765
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  • RIV/68081731:_____/00:12000027
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  • N/A (en)
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http://linked.open...ontrolniKodProRIV
  • [8A132051CAE7]
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  • Brno [CZ]
http://linked.open...i/riv/mistoVydani
  • Brno
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  • Proceedings of the 12th European Congress on Electron Microscopy.
http://linked.open...in/vavai/riv/obor
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  • Autrata, Rudolf
  • Jirák, Josef
  • Špinka, Jiří
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
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  • Czechoslovak Society for Electron Microscopy
https://schema.org/isbn
  • 80-238-5503-4
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