About: Measurement of Carbon Diffusion Coeficient

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About: Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Depth profiling mode of MiniSIMS device was applied to diffusion measurement. Calibration of crater depth was done using shearing interference microscope Zeiss Epival Interphako (ZEI) and confocal mikroskope Olympus LEXT OLS3100 with atomic force microscopy (AFM) modul. The ZEI uses one of the classical interferometric measuring methods. Generally this method leads to results with considerable experimental error. AFM is a very high-resolution type of scanning probe microscopy, with typical resolution of the order of fractions of nanometers, which is more than 1000 times better than the optical diffraction limit. However, the results taken by ZEI were in agreement with much more precise results of surface profiling achieved by AFM. It was found, at given experimental conditions (Fe-rich matrix, Ga + primary ions, 5 kV/3nA, DWT=1), that the sputter rate is some 0.3 nm per a single sputter scan of the crater area (50x50 µm). This depth calibration with SIMS technique can be applied to the study of carbon diffusion in BCC iron as an example. Special technique was developed, which avoids radio-tracer measurements with C-14. Obtained results are lower than the extrapolated values, which may be due to limited solubility of carbon in iron. Depth profiling mode of MiniSIMS device was applied to diffusion measurement. Calibration of crater depth was done using shearing interference microscope Zeiss Epival Interphako (ZEI) and confocal mikroskope Olympus LEXT OLS3100 with atomic force microscopy (AFM) modul. The ZEI uses one of the classical interferometric measuring methods. Generally this method leads to results with considerable experimental error. AFM is a very high-resolution type of scanning probe microscopy, with typical resolution of the order of fractions of nanometers, which is more than 1000 times better than the optical diffraction limit. However, the results taken by ZEI were in agreement with much more precise results of surface profiling achieved by AFM. It was found, at given experimental conditions (Fe-rich matrix, Ga + primary ions, 5 kV/3nA, DWT=1), that the sputter rate is some 0.3 nm per a single sputter scan of the crater area (50x50 µm). This depth calibration with SIMS technique can be applied to the study of carbon diffusion in BCC iron as an example. Special technique was developed, which avoids radio-tracer measurements with C-14. Obtained results are lower than the extrapolated values, which may be due to limited solubility of carbon in iron. (en)
Title	Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth (en)
skos:prefLabel	Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth (en)
skos:notation	RIV/68081723:_____/12:00385390!RIV13-GA0-68081723
http://linked.open...avai/riv/aktivita	I P Z
http://linked.open...avai/riv/aktivity	I, P(GAP108/11/0148), Z(AV0Z20410507)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Čermák, Jiří Král, Lubomír
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav fyziky materiálů AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	148857
http://linked.open...ai/riv/idVysledku	RIV/68081723:_____/12:00385390
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	carbon diffusion; ferrite; SIMS; carbides (en)
http://linked.open.../riv/klicoveSlovo	ferrite carbides carbon diffusion SIMS
http://linked.open...ontrolniKodProRIV	[FED3C4E08610]
http://linked.open...v/mistoKonaniAkce	Brno
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	METAL 2012 Conference Proceedings
http://linked.open...in/vavai/riv/obor	BJ
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Carbon diffusion in extremely carbon-supersaturated ferrite and austenite alloys
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Král, Lubomír Čermák, Jiří
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2012-05-23 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Physical properties of advanced materials in relation to their microstructure and processing
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	TANGER Ltd. Ostrava
https://schema.org/isbn	978-80-87294-31-4

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