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  • X-ray reciprocal space mapping was used for quantitative investigation of porous layers in indium phosphide. A new theoretical model in the frame of the statistical dynamical theory for cylindrical pores was developed and applied for numerical data evaluation. The analysis of reciprocal space maps provided comprehensive information on a wide range of the porous layer parameters, for example, layer thickness and porosity, orientation, and correlation length of segmented pore structures. The results are in a good agreement with scanning electron microscopy data
  • X-ray reciprocal space mapping was used for quantitative investigation of porous layers in indium phosphide. A new theoretical model in the frame of the statistical dynamical theory for cylindrical pores was developed and applied for numerical data evaluation. The analysis of reciprocal space maps provided comprehensive information on a wide range of the porous layer parameters, for example, layer thickness and porosity, orientation, and correlation length of segmented pore structures. The results are in a good agreement with scanning electron microscopy data (en)
Title
  • High-resolution synchrotron diffraction study of porous buffer InP(001) layers
  • High-resolution synchrotron diffraction study of porous buffer InP(001) layers (en)
skos:prefLabel
  • High-resolution synchrotron diffraction study of porous buffer InP(001) layers
  • High-resolution synchrotron diffraction study of porous buffer InP(001) layers (en)
skos:notation
  • RIV/67985882:_____/14:00436000!RIV15-AV0-67985882
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  • I
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  • 5
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  • 19160
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  • RIV/67985882:_____/14:00436000
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  • porous layers; X-ray reciprocal space mapping; indium phosphide (en)
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [BCF2A3A3C9DB]
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  • Journal of Applied Crystallography
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  • 47
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  • Nohavica, Dušan
  • Lomov, A. A.
  • Novikov, D. V.
  • Punegov, V. I.
  • Chuev, M. A.
  • Vasiliev, A. L.
http://linked.open...ain/vavai/riv/wos
  • 000342845900014
issn
  • 0021-8898
number of pages
http://bibframe.org/vocab/doi
  • 10.1107/S1600576714016392
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