About: Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles     Goto   Sponge   NotDistinct   Permalink

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  • Electrical properties of highly rectifying Pt/InP junctions fabricated by electrophoretic deposition of Pt nanoparticles are investigated at different temperatures by the measurement of current-voltage and capacitance-voltage characteristics. The forward I-V characteristics of the junction are described by thermionic emissions theory at low forward bias (3kT/q < V < 0.2 V) and by tunnelling current transport through the narrowed space charge region at forward bias V > 0.2 V. The reverse I-V characteristics are analysed in the scope of the thermionic emission model in the presence of shunt resistance. Electrical characteristics of these diodes are sensitive to gas mixtures with a low hydrogen concentration and show an extremely fast response and recovery time
  • Electrical properties of highly rectifying Pt/InP junctions fabricated by electrophoretic deposition of Pt nanoparticles are investigated at different temperatures by the measurement of current-voltage and capacitance-voltage characteristics. The forward I-V characteristics of the junction are described by thermionic emissions theory at low forward bias (3kT/q < V < 0.2 V) and by tunnelling current transport through the narrowed space charge region at forward bias V > 0.2 V. The reverse I-V characteristics are analysed in the scope of the thermionic emission model in the presence of shunt resistance. Electrical characteristics of these diodes are sensitive to gas mixtures with a low hydrogen concentration and show an extremely fast response and recovery time (en)
Title
  • Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles
  • Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles (en)
skos:prefLabel
  • Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles
  • Transport properties of metal-semiconductor junctions on n-type InP prepared by electrophoretic deposition of Pt nanoparticles (en)
skos:notation
  • RIV/67985882:_____/14:00428559!RIV15-AV0-67985882
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  • I, P(LD12014)
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  • 4
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  • 51105
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  • RIV/67985882:_____/14:00428559
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  • electrophoretic deposition; Pt nanoparticles; Schottky diodes (en)
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [586AB566CEA8]
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  • Semiconductor Science and Technology
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  • 29
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  • Grym, Jan
  • Yatskiv, Roman
  • Černohorský, Ondřej
  • Dimitrakopulos, G. P.
  • Komninou, Ph.
  • Bazioti, C.
  • Brus, V. V.
  • Maryanchuk, P. D.
http://linked.open...ain/vavai/riv/wos
  • 000333275600019
issn
  • 0268-1242
number of pages
http://bibframe.org/vocab/doi
  • 10.1088/0268-1242/29/4/045017
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