About: Determination of carrier profiles on bevelled GaAs structures by PCIV method

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Determination of free charge profiles of GaAs on a bevelled surface by PCIV is presented. The bevelled structure were prepared by chemical etching. The results are compared with the electrochemical capacitance-voltage technique. Determination of free charge profiles of GaAs on a bevelled surface by PCIV is presented. The bevelled structure were prepared by chemical etching. The results are compared with the electrochemical capacitance-voltage technique. (en) Je prezentováno určení profilu volných nosičů v GaAs na zešikmeném povrchu.Zešikmení bylo připraveno chemickým leptáním.Výsledky jsou srovnány s elektrochemickou kapacitně -napěťovou metodou. (cs)
Title	Determination of carrier profiles on bevelled GaAs structures by PCIV method Určení profilu nosičů na zešikmené GaAs struktuře pomocí PCIV metody (cs) Determination of carrier profiles on bevelled GaAs structures by PCIV method (en)
skos:prefLabel	Determination of carrier profiles on bevelled GaAs structures by PCIV method Určení profilu nosičů na zešikmené GaAs struktuře pomocí PCIV metody (cs) Determination of carrier profiles on bevelled GaAs structures by PCIV method (en)
skos:notation	RIV/67985882:_____/04:00105980!RIV/2005/AV0/A13005/N
http://linked.open.../vavai/riv/strany	261;264
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(KSK1010104)
http://linked.open...iv/cisloPeriodika	9-10
http://linked.open...vai/riv/dodaniDat	2005
http://linked.open...aciTvurceVysledku	Walachová, Jarmila
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav fotoniky a elektroniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	560056
http://linked.open...ai/riv/idVysledku	RIV/67985882:_____/04:00105980
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	impurity distribution (en)
http://linked.open.../riv/klicoveSlovo	impurity distribution
http://linked.open...odStatuVydavatele	SK - Slovenská republika
http://linked.open...ontrolniKodProRIV	[DD63C7BB038D]
http://linked.open...i/riv/nazevZdroje	Journal of Electrical Engineering
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Condensed matter physics and materials science
http://linked.open...UplatneniVysledku	2004
http://linked.open...v/svazekPeriodika	55
http://linked.open...iv/tvurceVysledku	Walachová, Jarmila Srnánek, R. Hulényi, L. Kinder, R. Radziewicz, D. Sciana, B. Tlaczala, M.
issn	1335-3632
number of pages	4 (xsd:int)

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