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  • InP Schottky junctions was prepared by using Cr+Au or Ag metallization and different surface pretreatment of InP to obtain good junctions suitable for application as zero bias detectors. Electrical characteristics were studied by current-voltage and capacitance voltage measurements in the temperature range of 80-320 K. Depending on the preparation conditions, the diodes exhibited a Schottky barrier height in the range of 0.38-0.49 eV with room temperature ideality factors in the range of 1.08-1.23.
  • InP Schottky junctions was prepared by using Cr+Au or Ag metallization and different surface pretreatment of InP to obtain good junctions suitable for application as zero bias detectors. Electrical characteristics were studied by current-voltage and capacitance voltage measurements in the temperature range of 80-320 K. Depending on the preparation conditions, the diodes exhibited a Schottky barrier height in the range of 0.38-0.49 eV with room temperature ideality factors in the range of 1.08-1.23. (en)
Title
  • InP Schotky junctions for zero bias detector diodes.
  • InP Schotky junctions for zero bias detector diodes. (en)
skos:prefLabel
  • InP Schotky junctions for zero bias detector diodes.
  • InP Schotky junctions for zero bias detector diodes. (en)
skos:notation
  • RIV/67985882:_____/03:13030020!RIV/2004/AV0/A13004/N
http://linked.open.../vavai/riv/strany
  • 113;116
http://linked.open...avai/riv/aktivita
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  • P(KSK1010104), Z(AV0Z2067918)
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  • 1/2
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  • 610633
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  • RIV/67985882:_____/03:13030020
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  • Schottky barriers; semiconductor technology (en)
http://linked.open.../riv/klicoveSlovo
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  • NL - Nizozemsko
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  • [5EB571CACA58]
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  • Vacuum
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  • 71
http://linked.open...iv/tvurceVysledku
  • Žďánský, Karel
  • Horvath, Zs. J.
  • Püspöki, S.
  • Rakovics, V.
  • Szentpáli, B.
http://linked.open...n/vavai/riv/zamer
issn
  • 0042-207X
number of pages
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