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  • We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement.
  • We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. (en)
Title
  • Recent progress with x-ray optics based on Si wafers and glass foils
  • Recent progress with x-ray optics based on Si wafers and glass foils (en)
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  • Recent progress with x-ray optics based on Si wafers and glass foils
  • Recent progress with x-ray optics based on Si wafers and glass foils (en)
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  • RIV/67985815:_____/08:00357504!RIV11-GA0-67985815
http://linked.open...avai/riv/aktivita
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  • P(GP202/07/P510), S
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  • 391691
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  • RIV/67985815:_____/08:00357504
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  • X-ray optics; Si wafers; glass foils (en)
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http://linked.open...ontrolniKodProRIV
  • [FE7D4DA973A5]
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  • Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray
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  • Hudec, René
  • Pína, L.
  • Inneman, A.
  • Míka, M.
  • Skulinová, Michaela
  • Šik, J.
  • Švéda, L.
  • Semencová, V.
  • Lorenc, J.
http://linked.open...vavai/riv/typAkce
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  • 000259563700034
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number of pages
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  • International Society for Optical Engineering
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  • 978-0-8194-7221-2
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