About: Multiscale semicontinuous thin film descriptors

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In experimental thin film physics, there is a demand to characterize a growing thin film or a thin film as an experimental result. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods has been collected and further developed, which resulted in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles have been analyzed in a multiscale manner. Descriptiveness of the proposed features is demonstrated on a few real experiment thin film photographs. This work has established a basis for further measurement, description, simulation or other processing in physics of semicontinuous thin films, using any direct imaging modality. In experimental thin film physics, there is a demand to characterize a growing thin film or a thin film as an experimental result. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods has been collected and further developed, which resulted in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles have been analyzed in a multiscale manner. Descriptiveness of the proposed features is demonstrated on a few real experiment thin film photographs. This work has established a basis for further measurement, description, simulation or other processing in physics of semicontinuous thin films, using any direct imaging modality. (en)
Title	Multiscale semicontinuous thin film descriptors Multiscale semicontinuous thin film descriptors (en)
skos:prefLabel	Multiscale semicontinuous thin film descriptors Multiscale semicontinuous thin film descriptors (en)
skos:notation	RIV/67985556:_____/04:00330314!RIV10-AV0-67985556
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(AV0Z1075907), Z(MSM 113200002)
http://linked.open...iv/cisloPeriodika	4
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Boldyš, Jiří
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav teorie informace a automatizace AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	575072
http://linked.open...ai/riv/idVysledku	RIV/67985556:_____/04:00330314
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	semicontinuous thin films; wavelet transform; segmentation; skeleton; graph representation (en)
http://linked.open.../riv/klicoveSlovo	segmentation wavelet transform semicontinuous thin films graph representation skeleton
http://linked.open...odStatuVydavatele	PL - Polská republika
http://linked.open...ontrolniKodProRIV	[4271AAB49B6D]
http://linked.open...i/riv/nazevZdroje	Central European Journal of Physics
http://linked.open...in/vavai/riv/obor	BD
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...UplatneniVysledku	2004
http://linked.open...v/svazekPeriodika	2
http://linked.open...iv/tvurceVysledku	Boldyš, Jiří Hrach, R.
http://linked.open...n/vavai/riv/zamer	Uncertainty methods in theoretical cybernetics: system identification, information processing, decision-making, and control http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20113200002
issn	1895-1082
number of pages	15 (xsd:int)

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