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  • Nanoparticles include any type of a particle with three dimensions of less than 100 nanometers. The study of such nanoparticles requires powerful microscopic techniques. In recent 20 years, the classical method, electron microscopy, was accompanied by another method, atomic force microscopy, based on scanning the sample with a sharp tip moving at a small distance above the sample. In comparison with electron microscopy, the application of atomic force microscopy offers the capability of three-imensional visualization and enables to get information on size and morpohology. However, there are often some deteriorations, a convolution being the most important one. In this review, we try to resume diverse applications, where atomic force microscopy was used to support a research of nanoparticles. Not only showing the range of applications, we highlight scopes, where atomic force microscopy exceeds electron microscopy methods and also draw attention to problems of atomic force microscopy imaging.
  • Nanoparticles include any type of a particle with three dimensions of less than 100 nanometers. The study of such nanoparticles requires powerful microscopic techniques. In recent 20 years, the classical method, electron microscopy, was accompanied by another method, atomic force microscopy, based on scanning the sample with a sharp tip moving at a small distance above the sample. In comparison with electron microscopy, the application of atomic force microscopy offers the capability of three-imensional visualization and enables to get information on size and morpohology. However, there are often some deteriorations, a convolution being the most important one. In this review, we try to resume diverse applications, where atomic force microscopy was used to support a research of nanoparticles. Not only showing the range of applications, we highlight scopes, where atomic force microscopy exceeds electron microscopy methods and also draw attention to problems of atomic force microscopy imaging. (en)
Title
  • The Role of Atomic Force Microscopy in Nanoparticle Research
  • The Role of Atomic Force Microscopy in Nanoparticle Research (en)
skos:prefLabel
  • The Role of Atomic Force Microscopy in Nanoparticle Research
  • The Role of Atomic Force Microscopy in Nanoparticle Research (en)
skos:notation
  • RIV/61989592:15310/10:10211985!RIV11-MSM-15310___
http://linked.open...avai/riv/aktivita
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  • P(1M0512), Z(MSM6198959218)
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  • 2
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  • 285679
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  • RIV/61989592:15310/10:10211985
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  • Atomic force microscopy, nanoparticle, particle characterization (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [427452E0A6F3]
http://linked.open...i/riv/nazevZdroje
  • Journal of Advanced Microscopy Research
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  • 5
http://linked.open...iv/tvurceVysledku
  • Vůjtek, Milan
  • Zbořil, Radek
  • Kubínek, Roman
http://linked.open...n/vavai/riv/zamer
issn
  • 2156-7573
number of pages
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  • 15310
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