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  • This report is focused on a studying of single-walled carbon nanotubes (SWCNTs) by different microscopic methods. It is important for the number of researches to know basic parameters of SWCNTs, especially a diameter and length of one nanotube or a bundle of nanotubes and a number of nanotubes in the bundle. For determination of these parameters Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) were used.
  • This report is focused on a studying of single-walled carbon nanotubes (SWCNTs) by different microscopic methods. It is important for the number of researches to know basic parameters of SWCNTs, especially a diameter and length of one nanotube or a bundle of nanotubes and a number of nanotubes in the bundle. For determination of these parameters Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) were used. (en)
Title
  • Usage of AFM, SEM and TEM for the research of carbon nanotubes
  • Usage of AFM, SEM and TEM for the research of carbon nanotubes (en)
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  • Usage of AFM, SEM and TEM for the research of carbon nanotubes
  • Usage of AFM, SEM and TEM for the research of carbon nanotubes (en)
skos:notation
  • RIV/61989592:15310/07:00004809!RIV10-MSM-15310___
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  • P(1M0512)
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  • 456878
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  • RIV/61989592:15310/07:00004809
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  • carbon nanotubes; Trasmission Electron Microscopy; Scanning Electron Microscopy; Atomic Force Microscopy (en)
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  • [DED5343C9025]
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  • Badajoz, Spain
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  • Modern Research and Educational Topics in Microscopy
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  • Vůjtek, Milan
  • Kubínek, Roman
  • Dvořák, A.
  • Šafářová, Klára
  • Rek, A.
number of pages
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  • 978-84-611-9420-9
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  • 15310
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