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Description
  • Atomic force microscopy (AFM) is a modern imaging technique that generates height representations of a sample surface with subnanometer resolution. Since 1986 it has evolved into a versatile tool which also provides maps of elastic and viscoelastic properties.
  • Atomic force microscopy (AFM) is a modern imaging technique that generates height representations of a sample surface with subnanometer resolution. Since 1986 it has evolved into a versatile tool which also provides maps of elastic and viscoelastic properties. (en)
Title
  • Atomic force microscopy : Studying mechanical properties of a cell
  • Atomic force microscopy : Studying mechanical properties of a cell (en)
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  • Atomic force microscopy : Studying mechanical properties of a cell
  • Atomic force microscopy : Studying mechanical properties of a cell (en)
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  • RIV/61989592:15110/12:33141168!RIV13-MSM-15110___
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  • P(ED0030/01/01), S
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  • 124022
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  • RIV/61989592:15110/12:33141168
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  • nanoindentation; stiffness tomography; Peak Force Tapping; adhesion; Young modulus; mechanical properties; atomic force microscopy (en)
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  • [355038FCDE66]
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  • Badajoz
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  • Microscopy book series number 5, Vol.1
http://linked.open...i/riv/nazevZdroje
  • Current microscopy Contributions to Advances in Science and Technology
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  • Kolářová, Hana
  • Zapletalová, Hana
  • Tománková, Kateřina
  • Malohlava, Jakub
number of pages
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  • Formatex
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  • 978-84-939843-5-9
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  • 15110
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