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  • Attenuated total reflection (ATR) is widely used in infrared spectral range for measurement of surface properties of solid samples, powders, and liquids. In this paper we use a commercial Fourier-transform infrared (FTIR) spectrometer Vertex 70v from Bruker company equipped with the ATR Golden Gate accessory from Specac. To increase sensitivity of the method we included infrared polarizer and analyzer, which enable measurement of the reflected amplitudes ratio and the phase differences between p- and s-polarizations in the frame of the ATR ellipsometry. Procedure of ellipsometric angles measurement is proposed using data acquisition at several azimuthal angles of polarizers. Spectral dependence of real polarizer extinction ratio, partial polarization of beam coming from the interferometer and polarization sensitivity of infrared detector are presented.
  • Attenuated total reflection (ATR) is widely used in infrared spectral range for measurement of surface properties of solid samples, powders, and liquids. In this paper we use a commercial Fourier-transform infrared (FTIR) spectrometer Vertex 70v from Bruker company equipped with the ATR Golden Gate accessory from Specac. To increase sensitivity of the method we included infrared polarizer and analyzer, which enable measurement of the reflected amplitudes ratio and the phase differences between p- and s-polarizations in the frame of the ATR ellipsometry. Procedure of ellipsometric angles measurement is proposed using data acquisition at several azimuthal angles of polarizers. Spectral dependence of real polarizer extinction ratio, partial polarization of beam coming from the interferometer and polarization sensitivity of infrared detector are presented. (en)
Title
  • Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure
  • Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure (en)
skos:prefLabel
  • Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure
  • Application of infrared ATR ellipsometry for measurement of solid samples: Calibration procedure (en)
skos:notation
  • RIV/61989100:27360/11:86080393!RIV12-GA0-27360___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ED0040/01/01), P(FR-TI3/053), P(GAP205/11/2137), Z(MSM6198910016)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 186793
http://linked.open...ai/riv/idVysledku
  • RIV/61989100:27360/11:86080393
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • FTIR spectrometry; polarization sensitivity; ATR ellipsometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [A539CEF1ABF9]
http://linked.open...v/mistoKonaniAkce
  • Praha
http://linked.open...i/riv/mistoVydani
  • Bellingham
http://linked.open...i/riv/nazevZdroje
  • Photonics, Devices, and Systems V : conference proceedings : 24-26 August 2011, Prague, Czech Republic
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hrabovský, David
  • Mrázková, Zuzana
  • Pištora, Jaromír
  • Postava, Kamil
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000297582500028
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
issn
  • 0277-786X
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE
https://schema.org/isbn
  • 978-0-8194-8953-1
http://localhost/t...ganizacniJednotka
  • 27360
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