About: Spectral polarimetry-based measurement of the thickness of a thin film

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances. A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances. (en)
Title	Spectral polarimetry-based measurement of the thickness of a thin film Spectral polarimetry-based measurement of the thickness of a thin film (en)
skos:prefLabel	Spectral polarimetry-based measurement of the thickness of a thin film Spectral polarimetry-based measurement of the thickness of a thin film (en)
skos:notation	RIV/61989100:27360/11:86078670!RIV12-MSM-27360___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ED0040/01/01), Z(MSM6198910016)
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Hlubina, Petr Ciprian, Dalibor Luňáček, Jiří
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola báňská - Technická univerzita Ostrava / Fakulta metalurgie a materiálového inženýrství
http://linked.open...dnocenehoVysledku	231371
http://linked.open...ai/riv/idVysledku	RIV/61989100:27360/11:86078670
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	spectral polarimetry, reflectance ratio, thin film, thickness (en)
http://linked.open.../riv/klicoveSlovo	reflectance ratio spectral polarimetry thickness thin film
http://linked.open...ontrolniKodProRIV	[EC6333C29F0F]
http://linked.open...v/mistoKonaniAkce	Mnichov
http://linked.open...i/riv/mistoVydani	Bellingham
http://linked.open...i/riv/nazevZdroje	Optical Measurement Systems for Industrial Inspection VII : 23-26 May 2011, Munich, Germany
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Regional materials science and technology centre
http://linked.open...UplatneniVysledku	2011
http://linked.open...iv/tvurceVysledku	Ciprian, Dalibor Hlubina, Petr Luňáček, Jiří
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open...ain/vavai/riv/wos	000295076900098
http://linked.open.../riv/zahajeniAkce	2011-05-23 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Syntéza, struktura a vlastnosti nanomateriálů založených na bázi interkalovaných fylosylikátů
issn	0277-786X
number of pages	8 (xsd:int)
http://purl.org/ne...btex#hasPublisher	SPIE
https://schema.org/isbn	978-0-8194-8678-3
http://localhost/t...ganizacniJednotka	27360

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