About: In situ monitoring of La0.67Sr0.33MnO3 monolayers grown by pulsed laser deposition     Goto   Sponge   NotDistinct   Permalink

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  • Integration of functional oxides on silicon is a key issue for the development of oxide-based electronics. For this purpose, monitoring the growth of these materials by an in situ technique becomes essential to control the thickness, the roughness and the oxidation state of the layers. Using a new static optical setup, i.e. with no modulation, we have studied the deposition and the annealing of pulsed-laser deposited La0.67Sr0.33MnO3 monolayers on pseudosubstrates SrTiO3(100)/Si at high temperature. We show that using the ratio of reflectance for the two different polarizations (s,p) R-p/R-s = tan(2)psi of the optical signal after reflection, we can follow, in situ, the growth of monolayers (ML) with a precision of one unit cell. Also, the growth mode and the annealing process leading to the determination of the activation energy can be precisely controlled. All these results are corroborated by X-ray diffraction (XRD) and atomic force microscopy (AFM).
  • Integration of functional oxides on silicon is a key issue for the development of oxide-based electronics. For this purpose, monitoring the growth of these materials by an in situ technique becomes essential to control the thickness, the roughness and the oxidation state of the layers. Using a new static optical setup, i.e. with no modulation, we have studied the deposition and the annealing of pulsed-laser deposited La0.67Sr0.33MnO3 monolayers on pseudosubstrates SrTiO3(100)/Si at high temperature. We show that using the ratio of reflectance for the two different polarizations (s,p) R-p/R-s = tan(2)psi of the optical signal after reflection, we can follow, in situ, the growth of monolayers (ML) with a precision of one unit cell. Also, the growth mode and the annealing process leading to the determination of the activation energy can be precisely controlled. All these results are corroborated by X-ray diffraction (XRD) and atomic force microscopy (AFM). (en)
Title
  • In situ monitoring of La0.67Sr0.33MnO3 monolayers grown by pulsed laser deposition
  • In situ monitoring of La0.67Sr0.33MnO3 monolayers grown by pulsed laser deposition (en)
skos:prefLabel
  • In situ monitoring of La0.67Sr0.33MnO3 monolayers grown by pulsed laser deposition
  • In situ monitoring of La0.67Sr0.33MnO3 monolayers grown by pulsed laser deposition (en)
skos:notation
  • RIV/61989100:27350/10:86075994!RIV11-MSM-27350___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • N
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  • 8
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 263280
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  • RIV/61989100:27350/10:86075994
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  • optical properties; magnetic oxides; magnetotransport; laser ablation deposition (en)
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  • DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV
  • [AC840410AB98]
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  • PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS
http://linked.open...in/vavai/riv/obor
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  • 247
http://linked.open...iv/tvurceVysledku
  • Postava, Kamil
  • Esteve, David
  • Gogol, Philippe
http://linked.open...ain/vavai/riv/wos
  • 000281092600019
issn
  • 0370-1972
number of pages
http://localhost/t...ganizacniJednotka
  • 27350
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