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Description
  • Magneto-optická ellipsometrie systémů obsahujících tlusté vrstvy (cs)
  • A recurrent matrix method for description and modeling of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick magnetooptic (MO) layers is proposed. Light interference in thin MO film is described by an amplitude-based Jones matrix formalism. For description of intensity summation in thick MO layers we propose using 4x4 coherence transforming matrices relating coherence vectors. The MO ellipsometry angles rotation and ellipticity are expressed in terms of the matrix components. Effects of partial coherence to reflection and transmission ellipsometry are discussed. Simplification of the general formalism is presented for the normal incidence polar MO geometry
  • A recurrent matrix method for description and modeling of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick magnetooptic (MO) layers is proposed. Light interference in thin MO film is described by an amplitude-based Jones matrix formalism. For description of intensity summation in thick MO layers we propose using 4x4 coherence transforming matrices relating coherence vectors. The MO ellipsometry angles rotation and ellipticity are expressed in terms of the matrix components. Effects of partial coherence to reflection and transmission ellipsometry are discussed. Simplification of the general formalism is presented for the normal incidence polar MO geometry (en)
Title
  • Magneto-optická ellipsometrie systémů obsahujících tlusté vrstvy (cs)
  • Magneto-optical ellipsometry of systems containing thick layers
  • Magneto-optical ellipsometry of systems containing thick layers (en)
skos:prefLabel
  • Magneto-optická ellipsometrie systémů obsahujících tlusté vrstvy (cs)
  • Magneto-optical ellipsometry of systems containing thick layers
  • Magneto-optical ellipsometry of systems containing thick layers (en)
skos:notation
  • RIV/61989100:27350/04:00011074!RIV/2005/GA0/273505/N
http://linked.open.../vavai/riv/strany
  • 615-618
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/03/0776), P(ME 507)
http://linked.open...iv/cisloPeriodika
  • 455-456
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 572085
http://linked.open...ai/riv/idVysledku
  • RIV/61989100:27350/04:00011074
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Magneto-optical ellipsometry;Incoherent effects;Thick layers;Partial coherence (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [636DEE81BA3F]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • Neuveden
http://linked.open...iv/tvurceVysledku
  • Pištora, Jaromír
  • Postava, Kamil
  • Životský, O.
  • Yamaguchi, T.
issn
  • 0040-6090
number of pages
http://localhost/t...ganizacniJednotka
  • 27350
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