About: Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition

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About: Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We have studied the initial stage of formation of carbon nanotube layers in surface decomposition of SiC substrate by meansof spectroscopic ellipsometry. Before heating, the surface of the SiC substrate was covered with an SiO layer that had been formed by natural oxidation. By heating up to 1100 C, reduction of SiO layer occurs. Between 1150 and 1300 C, the surface of SiC decomposes and a (graphiteqvoid) layer is formed on the surface. Then, by heating at 1300 C for longer time, a carbon nanotube layer is formed. As a result, we have detected the beginning of the surface decomposition at 1150 C and the beginning of the formation of a carbon nanotube layer at 1300 C. We have studied the initial stage of formation of carbon nanotube layers in surface decomposition of SiC substrate by meansof spectroscopic ellipsometry. Before heating, the surface of the SiC substrate was covered with an SiO layer that had been formed by natural oxidation. By heating up to 1100 C, reduction of SiO layer occurs. Between 1150 and 1300 C, the surface of SiC decomposes and a (graphiteqvoid) layer is formed on the surface. Then, by heating at 1300 C for longer time, a carbon nanotube layer is formed. As a result, we have detected the beginning of the surface decomposition at 1150 C and the beginning of the formation of a carbon nanotube layer at 1300 C. (en) Spektrální elipsometrie sestavy uhlíkových nanotrubic v SiC povrchovém rozkladu (cs)
Title	Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition (en) Spektrální elipsometrie sestavy uhlíkových nanotrubic v SiC povrchovém rozkladu (cs)
skos:prefLabel	Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition Spectroscopic ellipsometry of carbon nanotube formation in SiC surface decomposition (en) Spektrální elipsometrie sestavy uhlíkových nanotrubic v SiC povrchovém rozkladu (cs)
skos:notation	RIV/61989100:27350/04:00011059!RIV/2005/GA0/273505/N
http://linked.open.../vavai/riv/strany	339-343
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/03/0776), Z(MSM 272400019)
http://linked.open...iv/cisloPeriodika	455-456
http://linked.open...vai/riv/dodaniDat	2005
http://linked.open...aciTvurceVysledku	Postava, Kamil
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola báňská - Technická univerzita Ostrava / Hornicko-geologická fakulta
http://linked.open...dnocenehoVysledku	587391
http://linked.open...ai/riv/idVysledku	RIV/61989100:27350/04:00011059
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	carbon nanotube;silicon carbide;surface decomposition;spectroellipsometry (en)
http://linked.open.../riv/klicoveSlovo	silicon carbide spectroellipsometry surface decomposition carbon nanotube
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[C3B25CE34B02]
http://linked.open...i/riv/nazevZdroje	Thin Solid Films
http://linked.open...in/vavai/riv/obor	BH
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Magneto-optical effects in magnetic nanostructures
http://linked.open...UplatneniVysledku	2004
http://linked.open...v/svazekPeriodika	Neuveden
http://linked.open...iv/tvurceVysledku	Postava, Kamil Takahashi, K. Maeda, H. Aoyama, M. Matsumoto, K. Kawaguchi, Y.
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20272400019
issn	0040-6090
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	27350

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