About: Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films     Goto   Sponge   NotDistinct   Permalink

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Description
  • Připravená tenká vrstva kompozitní heterostruktury z vodivého polymeru a fullerenu je studována několika AFM metodami a mapovánim mikro-Ramanovskeho rozptylu. Studuje se vliv mikroskopických morfologických a elektronických vlastností vrstvy na její makroskopické chování (cs)
  • Prepared hetero-junction composite thin film of conductive polymer and fullerene is studied by several AFM techniques and micro-Raman mapping. The influence of microscopic morphologic and electronic properties on macroscopic behavior is discussed
  • Prepared hetero-junction composite thin film of conductive polymer and fullerene is studied by several AFM techniques and micro-Raman mapping. The influence of microscopic morphologic and electronic properties on macroscopic behavior is discussed (en)
Title
  • Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films
  • Korelace měření mikroskopie atomárních sil detekující lokální vodivost s mapováním mikro-Ramanovského rozptylu na tenkých vrstvách směsi polymeru s fullerenem (cs)
  • Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films (en)
skos:prefLabel
  • Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films
  • Korelace měření mikroskopie atomárních sil detekující lokální vodivost s mapováním mikro-Ramanovského rozptylu na tenkých vrstvách směsi polymeru s fullerenem (cs)
  • Correlation of atomic force microscopy detecting local conductivity and micro-Raman spectroscopy on polymer-fullerene composite films (en)
skos:notation
  • RIV/61389013:_____/07:00093055!RIV08-MSM-61389013
http://linked.open.../vavai/riv/strany
  • 193;195
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  • P(1M06031), P(GD202/05/H003), P(LC06040), P(LC510)
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  • 5
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  • 415141
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  • RIV/61389013:_____/07:00093055
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  • atomic force microscopy (AFM); composition and phase identification; photoconduction and photovoltaic effects; fullerens and related materials (en)
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  • DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV
  • [11B0AF1E972A]
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  • Physica Status Solidi
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  • 1
http://linked.open...iv/tvurceVysledku
  • Cimrová, Věra
  • Rezek, Bohuslav
  • Výprachtický, Drahomír
  • Ledinský, Martin
  • Čermák, Jan
  • Fejfar, Antonín
  • Kočka, Jan
  • Mates, Tomáš
issn
  • 1862-6254
number of pages
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