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Description
| - We present a complex study of rare earth elements implanted GaN layers grown by low pressure metalorganic vapor phase epitaxy on c-plane sapphire substrates. Gd, Dy, La and Lu ions were implanted with energies of 200 key and doses ranging from 5 x 10(13) to 4 x 10(17) atoms.cm(-2). The chemical composition and concentration profiles of ion-implanted layers were studied by secondary ion mass spectrometry and Rutherford back scattering. The structural properties of the layers were characterized by Rutherford back scattering/channeling and X-ray diffraction reciprocal space mapping.
- We present a complex study of rare earth elements implanted GaN layers grown by low pressure metalorganic vapor phase epitaxy on c-plane sapphire substrates. Gd, Dy, La and Lu ions were implanted with energies of 200 key and doses ranging from 5 x 10(13) to 4 x 10(17) atoms.cm(-2). The chemical composition and concentration profiles of ion-implanted layers were studied by secondary ion mass spectrometry and Rutherford back scattering. The structural properties of the layers were characterized by Rutherford back scattering/channeling and X-ray diffraction reciprocal space mapping. (en)
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Title
| - Magnetism in GaN layers implanted by La, Gd, Dy and Lu
- Magnetism in GaN layers implanted by La, Gd, Dy and Lu (en)
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skos:prefLabel
| - Magnetism in GaN layers implanted by La, Gd, Dy and Lu
- Magnetism in GaN layers implanted by La, Gd, Dy and Lu (en)
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skos:notation
| - RIV/61389005:_____/11:00365408!RIV12-AV0-61389005
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA104/09/0621), P(GA104/09/1269), P(GA106/09/0125), Z(AV0Z10100521), Z(AV0Z10480505), Z(MSM6046137302)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/61389005:_____/11:00365408
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - Magnetic semiconductors; III-V semiconductors; Ion implantation; X-ray diffraction; Rutherford backscattering spectroscopy (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - CH - Švýcarská konfederace
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Macková, Anna
- Peřina, Vratislav
- Maryško, Miroslav
- Hejtmánek, Jiří
- Mikulics, M.
- Sedmidubský, D.
- Sofer, Z.
- Buchal, C.
- Groetzschel, R.
- Hardtdegen, H.
- Moram, M.
- Václavů, M.
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http://linked.open...ain/vavai/riv/wos
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1016/j.tsf.2011.04.110
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