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  • Optimalizační experimenty s fokusujícím monochromátorem Si(220)pro difraktometr určený k měření zbytkových napětí v polykrystalických materiálech ukázaly velké přednosti v porovnání s konvenčními mozaikovými monochromátory. (cs)
  • Optimized diffractometer arrangements for residual strain measurements employing curved crystal monochromators provide good luminosity and a high Delta d/d resolution in the vicinity of usually used scattering angle 2 theta(S) 90 degrees. Due to a variety of designs of the diffractometers which could be installed at a constant or different take-off angles, except a few attempts, there is a lack of experimental evidence providing a help in a choice of parameters for an optimum performance. In addition to our earlier investigations with curved Si(311) monochromator employed in different diffraction geometries (see paper I [M.K. Moon et al., Physica B, submitted [1]]), the present paper presents the monochromator properties of cylindrically bent perfect Si(220) crystals as another candidate to be used as monochromator in residual strain diffractometers.
  • Optimized diffractometer arrangements for residual strain measurements employing curved crystal monochromators provide good luminosity and a high Delta d/d resolution in the vicinity of usually used scattering angle 2 theta(S) 90 degrees. Due to a variety of designs of the diffractometers which could be installed at a constant or different take-off angles, except a few attempts, there is a lack of experimental evidence providing a help in a choice of parameters for an optimum performance. In addition to our earlier investigations with curved Si(311) monochromator employed in different diffraction geometries (see paper I [M.K. Moon et al., Physica B, submitted [1]]), the present paper presents the monochromator properties of cylindrically bent perfect Si(220) crystals as another candidate to be used as monochromator in residual strain diffractometers. (en)
Title
  • Optimization of bent perfect Si(220)-crystal monochromator for residual strain/stress instrument - Part II
  • Optimization of bent perfect Si(220)-crystal monochromator for residual strain/stress instrument - Part II (en)
  • Optimalizace ohnutého monokrystalického monochromátoru Si(220) pro zařízení určené k měření zbytkových napětí – Část II (cs)
skos:prefLabel
  • Optimization of bent perfect Si(220)-crystal monochromator for residual strain/stress instrument - Part II
  • Optimization of bent perfect Si(220)-crystal monochromator for residual strain/stress instrument - Part II (en)
  • Optimalizace ohnutého monokrystalického monochromátoru Si(220) pro zařízení určené k měření zbytkových napětí – Část II (cs)
skos:notation
  • RIV/61389005:_____/05:00030678!RIV06-AV0-61389005
http://linked.open.../vavai/riv/strany
  • 70;75
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/03/0891), Z(AV0Z10480505), Z(MSM2672244501)
http://linked.open...iv/cisloPeriodika
  • -
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 534885
http://linked.open...ai/riv/idVysledku
  • RIV/61389005:_____/05:00030678
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • neutron diffraction; focusing; neutron diffraction (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [3040DE948D5B]
http://linked.open...i/riv/nazevZdroje
  • Physica. B
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 368
http://linked.open...iv/tvurceVysledku
  • Mikula, Pavol
  • Moon, M. K.
  • Hong, K. P.
http://linked.open...n/vavai/riv/zamer
issn
  • 0921-4526
number of pages
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