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rdf:type
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Description
| - Silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position sinsitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The first results of the TOF tests of lambda-scanning carried out with the FAD analyzer in combination with position sensitive detector are presented. The experimental test has proved that the analysis can be done with the accuracy delta k/k=10(-4) idependently of the pulse width, however, in the range of DELTA lambda/lambda of about 10-2. The first obtained experimental results indicate that the FAD geometry of the bent Si-slab in combination with 1d-PSD could be a good candidate for a high-resolution analyzer at some of the TOF instruments.
- Silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position sinsitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The first results of the TOF tests of lambda-scanning carried out with the FAD analyzer in combination with position sensitive detector are presented. The experimental test has proved that the analysis can be done with the accuracy delta k/k=10(-4) idependently of the pulse width, however, in the range of DELTA lambda/lambda of about 10-2. The first obtained experimental results indicate that the FAD geometry of the bent Si-slab in combination with 1d-PSD could be a good candidate for a high-resolution analyzer at some of the TOF instruments. (en)
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Title
| - Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
- Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry. (en)
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skos:prefLabel
| - Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
- Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry. (en)
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skos:notation
| - RIV/61389005:_____/03:49033119!RIV/2004/AV0/A49004/N
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA202/03/0891), P(IAA1048003), Z(AV0Z1048901)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/61389005:_____/03:49033119
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - neutron diffraction; bent perfect crystal (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/mistoVydani
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http://linked.open...vEdiceCisloSvazku
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http://linked.open...i/riv/nazevZdroje
| - Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...v/pocetStranKnihy
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http://linked.open...cetTvurcuVysledku
| |
http://linked.open...ocetUcastnikuAkce
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http://linked.open...nichUcastnikuAkce
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Mikula, Pavel
- Vrána, Miroslav
- Yasushige, Y.
- Furusaka, Y.
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
| - Forschungszentrum Julich GmbH
|