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  • Silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position sinsitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The first results of the TOF tests of lambda-scanning carried out with the FAD analyzer in combination with position sensitive detector are presented. The experimental test has proved that the analysis can be done with the accuracy delta k/k=10(-4) idependently of the pulse width, however, in the range of DELTA lambda/lambda of about 10-2. The first obtained experimental results indicate that the FAD geometry of the bent Si-slab in combination with 1d-PSD could be a good candidate for a high-resolution analyzer at some of the TOF instruments.
  • Silicon bent perfect crystal in fully asymmetric diffraction (FAD) geometry in combination with a linear position sinsitive detector can be effectively used for high-resolution analysis of a beam scattered by a sample. The first results of the TOF tests of lambda-scanning carried out with the FAD analyzer in combination with position sensitive detector are presented. The experimental test has proved that the analysis can be done with the accuracy delta k/k=10(-4) idependently of the pulse width, however, in the range of DELTA lambda/lambda of about 10-2. The first obtained experimental results indicate that the FAD geometry of the bent Si-slab in combination with 1d-PSD could be a good candidate for a high-resolution analyzer at some of the TOF instruments. (en)
Title
  • Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
  • Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry. (en)
skos:prefLabel
  • Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
  • Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry. (en)
skos:notation
  • RIV/61389005:_____/03:49033119!RIV/2004/AV0/A49004/N
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  • P(GA202/03/0891), P(IAA1048003), Z(AV0Z1048901)
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  • 607788
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  • RIV/61389005:_____/03:49033119
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  • neutron diffraction; bent perfect crystal (en)
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  • [A0EAFDB82191]
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  • Julich
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  • (1)
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  • Fully Asymmetric Diffraction Geometry of a Bent Perfect Crystal Silicon Analyzer for High-Resolution TOF Spectrometry.
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  • Mikula, Pavel
  • Vrána, Miroslav
  • Yasushige, Y.
  • Furusaka, Y.
http://linked.open...n/vavai/riv/zamer
number of pages
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  • Forschungszentrum Julich GmbH
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