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rdf:type
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Description
| - Non-invasive techniques utilizing X-ray radiation offer a significant advantage in scientific investigations of painted arts and other cultural artefacts such as painted artworks or statues. In addition, there is also great demand for a mobile analytical and real-time imaging device given the fact that many fine arts cannot be transported. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in the inner composition of a wide variety of objects. Moreover, it is able to map the surface distribution of the contained elements. Several transmission and emission techniques are presented which have been proposed and tested for the analysis of painted artworks.
- Non-invasive techniques utilizing X-ray radiation offer a significant advantage in scientific investigations of painted arts and other cultural artefacts such as painted artworks or statues. In addition, there is also great demand for a mobile analytical and real-time imaging device given the fact that many fine arts cannot be transported. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in the inner composition of a wide variety of objects. Moreover, it is able to map the surface distribution of the contained elements. Several transmission and emission techniques are presented which have been proposed and tested for the analysis of painted artworks. (en)
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Title
| - Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix
- Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix (en)
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skos:prefLabel
| - Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix
- Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix (en)
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skos:notation
| - RIV/61388980:_____/11:00375496!RIV12-AV0-61388980
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(LC06041), Z(AV0Z40320502), Z(MSM6046144603), Z(MSM6840770040)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/61388980:_____/11:00375496
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - inspection with x-rays; pixelated detectors and associated VLSI electronics; X-ray fluorescence (XRF) systems; X-ray radiography and digital radiography (DR) (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - GB - Spojené království Velké Británie a Severního Irska
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Journal of Instrumentation
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Hradil, David
- Hradilová, J.
- Jakůbek, J.
- Kroupa, M.
- Mislerová, H.
- Žemlička, J.
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http://linked.open...ain/vavai/riv/wos
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1088/1748-0221/6/01/C01066
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