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  • In this paper we present the results of morphological, mechanical and electrical investigation of the properties of prepared graphene flakes and graphene-based quantum Hall devices. AFM imaging allowed us to identify the local imperfections and unintentional modifications of the graphene sheets which had caused severe deterioration of the device electrical performance. Utilizing the NanoSwing imaging method, based on the time-resolved tapping mode, we could observe non-homogeneities of the structural and mechanical properties. We also diagnosed the device under working conditions by Kelvin probe microscopy and detected its local electric field distribution.
  • In this paper we present the results of morphological, mechanical and electrical investigation of the properties of prepared graphene flakes and graphene-based quantum Hall devices. AFM imaging allowed us to identify the local imperfections and unintentional modifications of the graphene sheets which had caused severe deterioration of the device electrical performance. Utilizing the NanoSwing imaging method, based on the time-resolved tapping mode, we could observe non-homogeneities of the structural and mechanical properties. We also diagnosed the device under working conditions by Kelvin probe microscopy and detected its local electric field distribution. (en)
Title
  • AFM diagnostics of graphene-based quantum Hall devices
  • AFM diagnostics of graphene-based quantum Hall devices (en)
skos:prefLabel
  • AFM diagnostics of graphene-based quantum Hall devices
  • AFM diagnostics of graphene-based quantum Hall devices (en)
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  • RIV/61388955:_____/12:00384166!RIV13-AV0-61388955
http://linked.open...avai/riv/aktivita
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  • Z(AV0Z40400503)
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  • 2-3
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  • 121268
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  • RIV/61388955:_____/12:00384166
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  • graphene; quantum Hall effect devices; atomic force microscopy (en)
http://linked.open.../riv/klicoveSlovo
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [E79AA7B36672]
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  • Micron
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  • 43
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  • Kalbáč, Martin
  • Ahlers, F. J.
  • Friedemann, M.
  • Sikora, A.
  • Woszczyna, M.
http://linked.open...ain/vavai/riv/wos
  • 000299605300054
http://linked.open...n/vavai/riv/zamer
issn
  • 0968-4328
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.micron.2011.11.010
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