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  • Surface Enhanced Raman Scattering (SERS) spectroscopy is a powerful analytical technique usually providing a Raman signal enhancement of ca 106. SERS is based on the inelastic photon scattering of molecules positioned in the proximity of a nanostructured metal surface. This method is widely applied to study a variety of problems in electrochemistry, surface science, material science, nanotechnology and biochemistry. In the present work, we have studied Raman enhancement in the dependence on the surface morphology of copper SERS-active substrates prepared in different ways, which was determined by using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). SERS spectra of selected organic thiols were measured and the relation between SERS efficiency and the surface structure of SERS-active substrates was described.
  • Surface Enhanced Raman Scattering (SERS) spectroscopy is a powerful analytical technique usually providing a Raman signal enhancement of ca 106. SERS is based on the inelastic photon scattering of molecules positioned in the proximity of a nanostructured metal surface. This method is widely applied to study a variety of problems in electrochemistry, surface science, material science, nanotechnology and biochemistry. In the present work, we have studied Raman enhancement in the dependence on the surface morphology of copper SERS-active substrates prepared in different ways, which was determined by using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). SERS spectra of selected organic thiols were measured and the relation between SERS efficiency and the surface structure of SERS-active substrates was described. (en)
  • Povrchem zesíleným Ramanovým rozptylem (Surface Enhanced Raman Scattering - SERS) se rozumí výrazné zesílení Ramanova rozptylu na kovových zdrsněných površích. Přeložená práce se zabývá přípravou měděných substrátů elektrochemicky katodickou redukcí. Nanostruktura povrchů takto připravených substrátů je studována pomocí mikroskopie atomárních sil a skenovací elektronové mikroskopie. (cs)
Title
  • AFM and SEM study of copper SERS-active substrates
  • Charakterizace měděných SERS aktivních substrátů pomocí mikroskopie atomárních sil a skenovací elektronové mikroskopie (cs)
  • AFM and SEM study of copper SERS-active substrates (en)
skos:prefLabel
  • AFM and SEM study of copper SERS-active substrates
  • Charakterizace měděných SERS aktivních substrátů pomocí mikroskopie atomárních sil a skenovací elektronové mikroskopie (cs)
  • AFM and SEM study of copper SERS-active substrates (en)
skos:notation
  • RIV/60461373:22340/08:00020229!RIV09-AV0-22340___
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  • P(GD104/08/H055), P(KAN208240651), Z(MSM6046137306), Z(MSM6046137307)
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  • 355074
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  • RIV/60461373:22340/08:00020229
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  • SERS-active substrate; AFM; SEM; nanostructure; copper (en)
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  • [0572EFA37CB6]
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  • Praha
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  • Praha
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  • Štěpánek, František
  • Matějka, Pavel
  • Čejková, Jitka
  • Prokopec, Vadym
  • Kokaislová, Alžběta
  • Brázdová, Soňa
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  • Czech Society of Chemical Engineering
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  • 978-80-02-02047-9
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  • 22340
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