About: Time dependence and mechanism of Au nanostructure transformation during annealing

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Melting point of thin nanostructured materials decreases with decreasing particle size. This can influence thermal stability of thin films used in electronic applications and compromise their function. Therefore it is desirable to explore connection between metal film thickness and its thermal stability. Thin films of Au were sputtered for 10-300 s (2-60 nm thick layers). Post deposition annealing was carried out at 150-300 degrees C for 15-180 min. Sheet electrical resistance measurements were employed to investigate electrical continuousness of the Au film. A significant leap in percolation threshold was found between samples annealed at 250 degrees C and 300 degrees C. This suggests that phase transition occurs during annealing, however, annealing for different times suggests the structural modification is a gradual and slow process, which is a sign of diffusion in a solid state. This was further supported by UV-Vis measurements which showed slow evolution of plasmon resonance peak. Convincing direct evidence of the surface morphology evolution was obtained by AFM microscopy. Melting point of thin nanostructured materials decreases with decreasing particle size. This can influence thermal stability of thin films used in electronic applications and compromise their function. Therefore it is desirable to explore connection between metal film thickness and its thermal stability. Thin films of Au were sputtered for 10-300 s (2-60 nm thick layers). Post deposition annealing was carried out at 150-300 degrees C for 15-180 min. Sheet electrical resistance measurements were employed to investigate electrical continuousness of the Au film. A significant leap in percolation threshold was found between samples annealed at 250 degrees C and 300 degrees C. This suggests that phase transition occurs during annealing, however, annealing for different times suggests the structural modification is a gradual and slow process, which is a sign of diffusion in a solid state. This was further supported by UV-Vis measurements which showed slow evolution of plasmon resonance peak. Convincing direct evidence of the surface morphology evolution was obtained by AFM microscopy. (en)
Title	Time dependence and mechanism of Au nanostructure transformation during annealing Time dependence and mechanism of Au nanostructure transformation during annealing (en)
skos:prefLabel	Time dependence and mechanism of Au nanostructure transformation during annealing Time dependence and mechanism of Au nanostructure transformation during annealing (en)
skos:notation	RIV/60461373:22310/14:43897650!RIV15-GA0-22310___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GBP108/12/G108)
http://linked.open...iv/cisloPeriodika	3
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Konrád, Peter Švorčík, Václav Kvítek, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola chemicko-technologická v Praze / Fakulta chemické technologie
http://linked.open...dnocenehoVysledku	50539
http://linked.open...ai/riv/idVysledku	RIV/60461373:22310/14:43897650
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	plasmon resonance; optical properties; electrical resistance; thin film; Gold (en)
http://linked.open.../riv/klicoveSlovo	Gold optical properties electrical resistance thin film plasmon resonance
http://linked.open...odStatuVydavatele	SG - Singapurská republika
http://linked.open...ontrolniKodProRIV	[2323B279349D]
http://linked.open...i/riv/nazevZdroje	Functional Materials Letters
http://linked.open...in/vavai/riv/obor	JJ
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Preparation, modification and characterization of materials by radiation
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	7
http://linked.open...iv/tvurceVysledku	Kvítek, Ondřej Švorčík, Václav Konrád, Peter
http://linked.open...ain/vavai/riv/wos	000336967500003
issn	1793-6047
number of pages	4 (xsd:int)
http://bibframe.org/vocab/doi	10.1142/S1793604714500222
http://localhost/t...ganizacniJednotka	22310

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