About: Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC     Goto   Sponge   NotDistinct   Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

AttributesValues
rdf:type
Description
  • Ni2Si, NiSi and NiSi2 contacts were prepared on n-type 4H- and 6H-SiC(0001) by deposition of Ni and Si multilayers in the respective stoichiometry after high-temperature annealing, as well as pure Ni contacts. After annealing, the individual contacts were analyzed by Raman spectroscopy and electrical property measurements. Contact structures were then etched-off and subsequently observed by means of AFM (Atomic Force Microscopy). Ni reacted with SiC, forming Ni2Si and carbon. At NixSiy/SiC contact structures the respective suicides were already formed at low annealing temperatures, when only Schottky behavior of the structures was observed. The intended silicides, once formed, did not change any further with increasing annealing temperature. All contact structures provided good ohmic behavior after being annealed at 960 degrees C. By means of combined AFM and Raman analysis of the etched-off contacts we found that the silicide contact structures very probably did not react with SiC which is in accordance with the thermodynamic assumptions. After annealing the silicide contact structures at such temperature, when Schottky behavior changed to ohmic, a certain form of interaction between the SiC substrate and the silicide contact structures must have occurred.
  • Ni2Si, NiSi and NiSi2 contacts were prepared on n-type 4H- and 6H-SiC(0001) by deposition of Ni and Si multilayers in the respective stoichiometry after high-temperature annealing, as well as pure Ni contacts. After annealing, the individual contacts were analyzed by Raman spectroscopy and electrical property measurements. Contact structures were then etched-off and subsequently observed by means of AFM (Atomic Force Microscopy). Ni reacted with SiC, forming Ni2Si and carbon. At NixSiy/SiC contact structures the respective suicides were already formed at low annealing temperatures, when only Schottky behavior of the structures was observed. The intended silicides, once formed, did not change any further with increasing annealing temperature. All contact structures provided good ohmic behavior after being annealed at 960 degrees C. By means of combined AFM and Raman analysis of the etched-off contacts we found that the silicide contact structures very probably did not react with SiC which is in accordance with the thermodynamic assumptions. After annealing the silicide contact structures at such temperature, when Schottky behavior changed to ohmic, a certain form of interaction between the SiC substrate and the silicide contact structures must have occurred. (en)
Title
  • Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC
  • Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC (en)
skos:prefLabel
  • Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC
  • Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC (en)
skos:notation
  • RIV/60461373:22310/12:43894328!RIV13-GA0-22310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GAP108/11/0894)
http://linked.open...iv/cisloPeriodika
  • 13
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 164031
http://linked.open...ai/riv/idVysledku
  • RIV/60461373:22310/12:43894328
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Thermodynamics; Atomic Force Microscopy; Raman spectroscopy; Silicides; Nickel; Ohmic contacts; Contacts; Silicon carbide (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV
  • [2AA2599EE87D]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 520
http://linked.open...iv/tvurceVysledku
  • Cichoň, Stanislav
  • Machovič, Vladimír
  • Macháč, Petr
  • Slepička, Petr
  • Barda, Bohumil
http://linked.open...ain/vavai/riv/wos
  • 000303084200026
issn
  • 0040-6090
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.tsf.2012.02.008
http://localhost/t...ganizacniJednotka
  • 22310
Faceted Search & Find service v1.16.118 as of Jun 21 2024


Alternative Linked Data Documents: ODE     Content Formats:   [cxml] [csv]     RDF   [text] [turtle] [ld+json] [rdf+json] [rdf+xml]     ODATA   [atom+xml] [odata+json]     Microdata   [microdata+json] [html]    About   
This material is Open Knowledge   W3C Semantic Web Technology [RDF Data] Valid XHTML + RDFa
OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 48 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software