About: ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor

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About: ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Presented experiments utilize methanolic solution of zinc acetyl-acetonate as a precursor and sapphire (001) as a substrate for deposition of thin films of ZnO. The X-ray diffraction analysis revealed polycrystalline character of prepared films with preferential growth orientation along c-axis. The roughness of prepared films was assessed by AFM microscopy and represented by roughness root mean square (RMS) value in range of 1.8 - 433 nm. The surface morphology was mapped by scanning electron microscopy showing periodical structure with several local defects. The optical transmittance spectrum of ZnO films was measured in wavelength range of 200-1000 nm. Prepared films are transparent in visible range with sharp ultra-violet cut-off at approximately 370 nm. Raman spectroscopy confirmed wurtzite structure and the presence of compressive stress within its structure as well as the occurrence of oxygen vacancies. The four-point Van der Pauw method was used to study the transport prosperities. The resistivity of presented ZnO films was found 8 x 10(-2). Omega cm with carrier density of 1.3 x 10(18) cm(-3) and electron mobility of 40 cm(2) v(-1) s(-1). Presented experiments utilize methanolic solution of zinc acetyl-acetonate as a precursor and sapphire (001) as a substrate for deposition of thin films of ZnO. The X-ray diffraction analysis revealed polycrystalline character of prepared films with preferential growth orientation along c-axis. The roughness of prepared films was assessed by AFM microscopy and represented by roughness root mean square (RMS) value in range of 1.8 - 433 nm. The surface morphology was mapped by scanning electron microscopy showing periodical structure with several local defects. The optical transmittance spectrum of ZnO films was measured in wavelength range of 200-1000 nm. Prepared films are transparent in visible range with sharp ultra-violet cut-off at approximately 370 nm. Raman spectroscopy confirmed wurtzite structure and the presence of compressive stress within its structure as well as the occurrence of oxygen vacancies. The four-point Van der Pauw method was used to study the transport prosperities. The resistivity of presented ZnO films was found 8 x 10(-2). Omega cm with carrier density of 1.3 x 10(18) cm(-3) and electron mobility of 40 cm(2) v(-1) s(-1). (en)
Title	ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor (en)
skos:prefLabel	ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor ZnO thin films prepared by spray-pyrolysis technique from organo-metallic precursor (en)
skos:notation	RIV/60461373:22310/12:43893549!RIV13-GA0-22310___
http://linked.open...avai/riv/aktivita	P S
http://linked.open...avai/riv/aktivity	P(GA104/09/0621), S
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Sedmidubský, David Nádherný, Ladislav Sofer, Zdeněk Jankovský, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola chemicko-technologická v Praze / Fakulta chemické technologie
http://linked.open...dnocenehoVysledku	182769
http://linked.open...ai/riv/idVysledku	RIV/60461373:22310/12:43893549
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	Zinc acetyl-acetonate; Spray-pyrolysis; Thin films; Zinc oxide (en)
http://linked.open.../riv/klicoveSlovo	Spray-pyrolysis Zinc acetyl-acetonate Thin films Zinc oxide
http://linked.open...odStatuVydavatele	CZ - Česká republika
http://linked.open...ontrolniKodProRIV	[69C46C33CD8A]
http://linked.open...i/riv/nazevZdroje	Ceramics-Silikáty
http://linked.open...in/vavai/riv/obor	CA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	ZnO-based magnetic semiconductors
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	56
http://linked.open...iv/tvurceVysledku	Sofer, Zdeněk Sedmidubský, David Jankovský, Ondřej Mikulics, Martin Nádherný, Ladislav
http://linked.open...ain/vavai/riv/wos	000307678000005
issn	0862-5468
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	22310

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