About: 3D characterization of material structure using scanning electron microscopy and focused ion beam

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The importance of knowledge of the microstructure and its subsequent influence on properties is a basic tenet of material science. However, many commonly used characterization methods (e.g. scanning electron microscopy ? SEM) provide only information in two dimensions (2D) and do not allow to obtain depth profile of material. The possibilities of analysis can be enhanced by utilizing focused ion beam (FIB). The FIB instrument allows revealing the structure in the third dimension by controlled and precise milling of the material. In combination with electron beam and suitable detector is possible to describe crystallography (EBSD) or chemical composition (EDS) etc. in three dimensions (3D). Thus, it is feasible to define real size, shape and distribution of microstructure features such as grains, grain boundaries, phases, precipitates and micropores. The importance of knowledge of the microstructure and its subsequent influence on properties is a basic tenet of material science. However, many commonly used characterization methods (e.g. scanning electron microscopy ? SEM) provide only information in two dimensions (2D) and do not allow to obtain depth profile of material. The possibilities of analysis can be enhanced by utilizing focused ion beam (FIB). The FIB instrument allows revealing the structure in the third dimension by controlled and precise milling of the material. In combination with electron beam and suitable detector is possible to describe crystallography (EBSD) or chemical composition (EDS) etc. in three dimensions (3D). Thus, it is feasible to define real size, shape and distribution of microstructure features such as grains, grain boundaries, phases, precipitates and micropores. (en)
Title	3D characterization of material structure using scanning electron microscopy and focused ion beam 3D characterization of material structure using scanning electron microscopy and focused ion beam (en)
skos:prefLabel	3D characterization of material structure using scanning electron microscopy and focused ion beam 3D characterization of material structure using scanning electron microscopy and focused ion beam (en)
skos:notation	RIV/60461373:22310/10:00023126!RIV11-MSM-22310___
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN300100801), Z(MSM6046137302)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Lejček, Pavel Hradilová, Monika
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoká škola chemicko-technologická v Praze / Fakulta chemické technologie
http://linked.open...dnocenehoVysledku	300947
http://linked.open...ai/riv/idVysledku	RIV/60461373:22310/10:00023126
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	structure; SEM; FIB (en)
http://linked.open.../riv/klicoveSlovo	SEM FIB structure
http://linked.open...ontrolniKodProRIV	[96E60E155F03]
http://linked.open...v/mistoKonaniAkce	Rožnov pod Radhoštěm
http://linked.open...i/riv/mistoVydani	Ostrava
http://linked.open...i/riv/nazevZdroje	METAL 2010
http://linked.open...in/vavai/riv/obor	JG
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Multifunctional bulk metallic materials with nanocrystalline and ultrafine-grained structure
http://linked.open...UplatneniVysledku	2010
http://linked.open...iv/tvurceVysledku	Lejček, Pavel Jäger, A. Hradilová, Monika Vystavěl, T.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2010-01-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	Preparation and research of functional materials and material technologies using micro- and nanoscopic methods
number of pages	5 (xsd:int)
http://purl.org/ne...btex#hasPublisher	TANGER
https://schema.org/isbn	978-80-87294-15-4
http://localhost/t...ganizacniJednotka	22310

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